THE PHYSICS OF AMORPHOUS-SILICON THIN-FILM TRANSISTORS

[51] EVIDENCE FOR EXPONENTIAL BAND TAILS IN AMORPHOUS-SILICON HYDRIDE [J]. PHYSICAL REVIEW LETTERS, 1981, 46 (21) : 1425 - 1428

[52] RESOLUTION OF AMORPHOUS-SILICON THIN-FILM TRANSISTOR INSTABILITY MECHANISMS USING AMBIPOLAR TRANSISTORS [J]. APPLIED PHYSICS LETTERS, 1987, 51 (14) : 1094 - 1096

[53] PHOTO-FIELD EFFECT IN AMORPHOUS-SILICON THIN-FILM TRANSISTORS [J]. JOURNAL OF APPLIED PHYSICS, 1986, 60 (04) : 1521 - 1527

[54] VANBERKEL C, 1989, J APPL PHYS, V66

[55] VANBERKEL C, 1987, MATER RES SOC S P, V95, P445

[56] METHOD FOR DETERMINATION OF HIGH-FIELD CONDUCTION LAWS IN INSULATING FILMS IN PRESENCE OF CHARGE TRAPPING [J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (03) : 1178 - +

[57] AN IMPROVED FIELD-EFFECT ANALYSIS FOR THE DETERMINATION OF THE PSEUDOGAP-STATE DENSITY IN AMORPHOUS-SEMICONDUCTORS [J]. PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1981, 44 (01): : 83 - 93

[58] NUMERICAL-ANALYSIS OF THE DYNAMIC CHARACTERISTICS OF AMORPHOUS-SILICON THIN-FILM TRANSISTORS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1988, 27 (05): : L919 - L921

[51] EVIDENCE FOR EXPONENTIAL BAND TAILS IN AMORPHOUS-SILICON HYDRIDE [J]. PHYSICAL REVIEW LETTERS, 1981, 46 (21) : 1425 - 1428

[52] RESOLUTION OF AMORPHOUS-SILICON THIN-FILM TRANSISTOR INSTABILITY MECHANISMS USING AMBIPOLAR TRANSISTORS [J]. APPLIED PHYSICS LETTERS, 1987, 51 (14) : 1094 - 1096

[53] PHOTO-FIELD EFFECT IN AMORPHOUS-SILICON THIN-FILM TRANSISTORS [J]. JOURNAL OF APPLIED PHYSICS, 1986, 60 (04) : 1521 - 1527

[54] VANBERKEL C, 1989, J APPL PHYS, V66

[55] VANBERKEL C, 1987, MATER RES SOC S P, V95, P445

[56] METHOD FOR DETERMINATION OF HIGH-FIELD CONDUCTION LAWS IN INSULATING FILMS IN PRESENCE OF CHARGE TRAPPING [J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (03) : 1178 - +

[57] AN IMPROVED FIELD-EFFECT ANALYSIS FOR THE DETERMINATION OF THE PSEUDOGAP-STATE DENSITY IN AMORPHOUS-SEMICONDUCTORS [J]. PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1981, 44 (01): : 83 - 93

[58] NUMERICAL-ANALYSIS OF THE DYNAMIC CHARACTERISTICS OF AMORPHOUS-SILICON THIN-FILM TRANSISTORS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1988, 27 (05): : L919 - L921