学术探索
学术期刊
新闻热点
数据分析
智能评审
立即登录
EPITAXIAL-GROWTH ON INP SUBSTRATES ETCHED WITH METHANE REACTIVE ION ETCHING TECHNIQUE
被引:11
作者
:
HENRY, L
论文数:
0
引用数:
0
h-index:
0
机构:
THOMSON CSF,LCR,F-91404 ORSAY,FRANCE
THOMSON CSF,LCR,F-91404 ORSAY,FRANCE
HENRY, L
[
1
]
VAUDRY, C
论文数:
0
引用数:
0
h-index:
0
机构:
THOMSON CSF,LCR,F-91404 ORSAY,FRANCE
THOMSON CSF,LCR,F-91404 ORSAY,FRANCE
VAUDRY, C
[
1
]
LECORRE, A
论文数:
0
引用数:
0
h-index:
0
机构:
THOMSON CSF,LCR,F-91404 ORSAY,FRANCE
THOMSON CSF,LCR,F-91404 ORSAY,FRANCE
LECORRE, A
[
1
]
LECROSNIER, D
论文数:
0
引用数:
0
h-index:
0
机构:
THOMSON CSF,LCR,F-91404 ORSAY,FRANCE
THOMSON CSF,LCR,F-91404 ORSAY,FRANCE
LECROSNIER, D
[
1
]
ALNOT, P
论文数:
0
引用数:
0
h-index:
0
机构:
THOMSON CSF,LCR,F-91404 ORSAY,FRANCE
THOMSON CSF,LCR,F-91404 ORSAY,FRANCE
ALNOT, P
[
1
]
OLIVIER, J
论文数:
0
引用数:
0
h-index:
0
机构:
THOMSON CSF,LCR,F-91404 ORSAY,FRANCE
THOMSON CSF,LCR,F-91404 ORSAY,FRANCE
OLIVIER, J
[
1
]
机构
:
[1]
THOMSON CSF,LCR,F-91404 ORSAY,FRANCE
来源
:
ELECTRONICS LETTERS
|
1989年
/ 25卷
/ 18期
关键词
:
D O I
:
10.1049/el:19890843
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:1257 / 1259
页数:3
相关论文
共 8 条
[1]
ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY FOR THE CHARACTERIZATION OF GAAS(001) SURFACES
ALNOT, P
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822
UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822
ALNOT, P
OLIVIER, J
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822
UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822
OLIVIER, J
WYCZISK, F
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822
UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822
WYCZISK, F
FADLEY, CS
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822
UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822
FADLEY, CS
[J].
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,
1987,
43
(3-4)
: 263
-
286
[2]
ALNOT P, 1989, J ELECTRON SPECTROSC, V49, P157
[3]
REACTIVE ION ETCHING OF GAAS USING A MIXTURE OF METHANE AND HYDROGEN
CHEUNG, R
论文数:
0
引用数:
0
h-index:
0
机构:
Univ of Glasgow, Glasgow, Scotl, Univ of Glasgow, Glasgow, Scotl
CHEUNG, R
THOMS, S
论文数:
0
引用数:
0
h-index:
0
机构:
Univ of Glasgow, Glasgow, Scotl, Univ of Glasgow, Glasgow, Scotl
THOMS, S
BEAMONT, SP
论文数:
0
引用数:
0
h-index:
0
机构:
Univ of Glasgow, Glasgow, Scotl, Univ of Glasgow, Glasgow, Scotl
BEAMONT, SP
DOUGHTY, G
论文数:
0
引用数:
0
h-index:
0
机构:
Univ of Glasgow, Glasgow, Scotl, Univ of Glasgow, Glasgow, Scotl
DOUGHTY, G
LAW, V
论文数:
0
引用数:
0
h-index:
0
机构:
Univ of Glasgow, Glasgow, Scotl, Univ of Glasgow, Glasgow, Scotl
LAW, V
WILKINSON, CDW
论文数:
0
引用数:
0
h-index:
0
机构:
Univ of Glasgow, Glasgow, Scotl, Univ of Glasgow, Glasgow, Scotl
WILKINSON, CDW
[J].
ELECTRONICS LETTERS,
1987,
23
(16)
: 857
-
859
[4]
NOVEL PROCESS FOR INTEGRATION OF OPTOELECTRONIC DEVICES USING REACTIVE ION ETCHING WITHOUT CHLORINATED GAS
HENRY, L
论文数:
0
引用数:
0
h-index:
0
机构:
ALCATEL CIT,DIV IND,F-92240 MALAKOFF,FRANCE
ALCATEL CIT,DIV IND,F-92240 MALAKOFF,FRANCE
HENRY, L
VAUDRY, C
论文数:
0
引用数:
0
h-index:
0
机构:
ALCATEL CIT,DIV IND,F-92240 MALAKOFF,FRANCE
ALCATEL CIT,DIV IND,F-92240 MALAKOFF,FRANCE
VAUDRY, C
GRANJOUX, P
论文数:
0
引用数:
0
h-index:
0
机构:
ALCATEL CIT,DIV IND,F-92240 MALAKOFF,FRANCE
ALCATEL CIT,DIV IND,F-92240 MALAKOFF,FRANCE
GRANJOUX, P
[J].
ELECTRONICS LETTERS,
1987,
23
(24)
: 1253
-
1254
[5]
GALNAS JUNCTION FET FULLY DRY ETCHED BY METAL ORGANIC REACTIVE ION ETCHING TECHNIQUE
LECROSNIER, D
论文数:
0
引用数:
0
h-index:
0
机构:
CNET, Lannion, Fr, CNET, Lannion, Fr
LECROSNIER, D
HENRY, L
论文数:
0
引用数:
0
h-index:
0
机构:
CNET, Lannion, Fr, CNET, Lannion, Fr
HENRY, L
LECORRE, A
论文数:
0
引用数:
0
h-index:
0
机构:
CNET, Lannion, Fr, CNET, Lannion, Fr
LECORRE, A
VAUDRY, C
论文数:
0
引用数:
0
h-index:
0
机构:
CNET, Lannion, Fr, CNET, Lannion, Fr
VAUDRY, C
[J].
ELECTRONICS LETTERS,
1987,
23
(24)
: 1254
-
1255
[6]
NIGGEBRUGE U, 1985, NOVEL PROCESS REACTI
[7]
ESTIMATION OF STRUCTURAL DAMAGE INDUCED BY CHEMICAL OR IONIC PROCESSES ON THE SURFACE OF CRYSTALLINE BINARY COMPOUNDS BY X-RAY PHOTOELECTRON DIFFRACTION - APPLICATION TO CHEMICALLY ETCHED GAAS (001) SURFACE
OLIVIER, J
论文数:
0
引用数:
0
h-index:
0
OLIVIER, J
ALNOT, P
论文数:
0
引用数:
0
h-index:
0
ALNOT, P
[J].
SEMICONDUCTOR SCIENCE AND TECHNOLOGY,
1989,
4
(02)
: 63
-
66
[8]
AR ION-BEAM ETCHING CHARACTERISTICS AND DAMAGE PRODUCTION IN INP
WADA, O
论文数:
0
引用数:
0
h-index:
0
机构:
Fukitsu Lab ltd, Atsugi, Jpn, Fukitsu Lab ltd, Atsugi, Jpn
WADA, O
[J].
JOURNAL OF PHYSICS D-APPLIED PHYSICS,
1984,
17
(12)
: 2429
-
2437
←
1
→
共 8 条
[1]
ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY FOR THE CHARACTERIZATION OF GAAS(001) SURFACES
ALNOT, P
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822
UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822
ALNOT, P
OLIVIER, J
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822
UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822
OLIVIER, J
WYCZISK, F
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822
UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822
WYCZISK, F
FADLEY, CS
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822
UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822
FADLEY, CS
[J].
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,
1987,
43
(3-4)
: 263
-
286
[2]
ALNOT P, 1989, J ELECTRON SPECTROSC, V49, P157
[3]
REACTIVE ION ETCHING OF GAAS USING A MIXTURE OF METHANE AND HYDROGEN
CHEUNG, R
论文数:
0
引用数:
0
h-index:
0
机构:
Univ of Glasgow, Glasgow, Scotl, Univ of Glasgow, Glasgow, Scotl
CHEUNG, R
THOMS, S
论文数:
0
引用数:
0
h-index:
0
机构:
Univ of Glasgow, Glasgow, Scotl, Univ of Glasgow, Glasgow, Scotl
THOMS, S
BEAMONT, SP
论文数:
0
引用数:
0
h-index:
0
机构:
Univ of Glasgow, Glasgow, Scotl, Univ of Glasgow, Glasgow, Scotl
BEAMONT, SP
DOUGHTY, G
论文数:
0
引用数:
0
h-index:
0
机构:
Univ of Glasgow, Glasgow, Scotl, Univ of Glasgow, Glasgow, Scotl
DOUGHTY, G
LAW, V
论文数:
0
引用数:
0
h-index:
0
机构:
Univ of Glasgow, Glasgow, Scotl, Univ of Glasgow, Glasgow, Scotl
LAW, V
WILKINSON, CDW
论文数:
0
引用数:
0
h-index:
0
机构:
Univ of Glasgow, Glasgow, Scotl, Univ of Glasgow, Glasgow, Scotl
WILKINSON, CDW
[J].
ELECTRONICS LETTERS,
1987,
23
(16)
: 857
-
859
[4]
NOVEL PROCESS FOR INTEGRATION OF OPTOELECTRONIC DEVICES USING REACTIVE ION ETCHING WITHOUT CHLORINATED GAS
HENRY, L
论文数:
0
引用数:
0
h-index:
0
机构:
ALCATEL CIT,DIV IND,F-92240 MALAKOFF,FRANCE
ALCATEL CIT,DIV IND,F-92240 MALAKOFF,FRANCE
HENRY, L
VAUDRY, C
论文数:
0
引用数:
0
h-index:
0
机构:
ALCATEL CIT,DIV IND,F-92240 MALAKOFF,FRANCE
ALCATEL CIT,DIV IND,F-92240 MALAKOFF,FRANCE
VAUDRY, C
GRANJOUX, P
论文数:
0
引用数:
0
h-index:
0
机构:
ALCATEL CIT,DIV IND,F-92240 MALAKOFF,FRANCE
ALCATEL CIT,DIV IND,F-92240 MALAKOFF,FRANCE
GRANJOUX, P
[J].
ELECTRONICS LETTERS,
1987,
23
(24)
: 1253
-
1254
[5]
GALNAS JUNCTION FET FULLY DRY ETCHED BY METAL ORGANIC REACTIVE ION ETCHING TECHNIQUE
LECROSNIER, D
论文数:
0
引用数:
0
h-index:
0
机构:
CNET, Lannion, Fr, CNET, Lannion, Fr
LECROSNIER, D
HENRY, L
论文数:
0
引用数:
0
h-index:
0
机构:
CNET, Lannion, Fr, CNET, Lannion, Fr
HENRY, L
LECORRE, A
论文数:
0
引用数:
0
h-index:
0
机构:
CNET, Lannion, Fr, CNET, Lannion, Fr
LECORRE, A
VAUDRY, C
论文数:
0
引用数:
0
h-index:
0
机构:
CNET, Lannion, Fr, CNET, Lannion, Fr
VAUDRY, C
[J].
ELECTRONICS LETTERS,
1987,
23
(24)
: 1254
-
1255
[6]
NIGGEBRUGE U, 1985, NOVEL PROCESS REACTI
[7]
ESTIMATION OF STRUCTURAL DAMAGE INDUCED BY CHEMICAL OR IONIC PROCESSES ON THE SURFACE OF CRYSTALLINE BINARY COMPOUNDS BY X-RAY PHOTOELECTRON DIFFRACTION - APPLICATION TO CHEMICALLY ETCHED GAAS (001) SURFACE
OLIVIER, J
论文数:
0
引用数:
0
h-index:
0
OLIVIER, J
ALNOT, P
论文数:
0
引用数:
0
h-index:
0
ALNOT, P
[J].
SEMICONDUCTOR SCIENCE AND TECHNOLOGY,
1989,
4
(02)
: 63
-
66
[8]
AR ION-BEAM ETCHING CHARACTERISTICS AND DAMAGE PRODUCTION IN INP
WADA, O
论文数:
0
引用数:
0
h-index:
0
机构:
Fukitsu Lab ltd, Atsugi, Jpn, Fukitsu Lab ltd, Atsugi, Jpn
WADA, O
[J].
JOURNAL OF PHYSICS D-APPLIED PHYSICS,
1984,
17
(12)
: 2429
-
2437
←
1
→