DEPTH PROFILES OF SODIUM AND CALCIUM IN GLASSES - COMPARISON OF SECONDARY ION MASS ANALYSIS AND AUGER SPECTROMETRY

被引：21

作者：

MALM, DL ^{[1
]}

VASILE, MJ ^{[1
]}

PADDEN, FJ ^{[1
]}

DOVE, DB ^{[1
]}

PANTANO, CG ^{[1
]}

机构：

[1] UNIV FLORIDA,DEPT MAT SCI & ENGN,GAINESVILLE,FL 32611

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1978年 / 15卷 / 01期

关键词：

D O I：

10.1116/1.569433

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：35 / 38

页数：4

共 8 条

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[7] AES COMPOSITIONAL PROFILES OF MOBILE IONS IN SURFACE REGION OF GLASS [J].

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