ON THE INTERPRETATION OF CURRENT IMAGES IN SCANNING TUNNELING SPECTROSCOPY OF SI(111)7X7

被引：11

作者：

BERGHAUS, T

BRODDE, A

NEDDERMEYER, H

TOSCH, S

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1988年 / 6卷 / 02期

关键词：

D O I：

10.1116/1.575364

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：483 / 487

页数：5

共 19 条

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[5]

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[8]

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[10] THEORY OF SCANNING TUNNELING MICROSCOPY AND SPECTROSCOPY - RESOLUTION, IMAGE AND FIELD STATES, AND THIN OXIDE LAYERS [J].

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