ABINITIO STUDIES OF SILANE DECOMPOSITION ON SI(100)

被引:25
作者
JING, Z [1 ]
WHITTEN, JL [1 ]
机构
[1] N CAROLINA STATE UNIV,DEPT CHEM,RALEIGH,NC 27695
来源
PHYSICAL REVIEW B | 1991年 / 44卷 / 04期
关键词
D O I
10.1103/PhysRevB.44.1741
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The mechanism of silane decomposition on the Si(100)-(2 X 1) surface is investigated in the context of a many-electron theory that permits the accurate computation of molecule-solid surface interactions at an ab initio configuration-interaction level. The adsorbate and local surface region are treated as embedded in the remainder of the lattice electronic distribution, which is modeled as a three-layer, 19-Si-plus-21-H cluster. A possible energetic pathway is found for the reaction SiH4 --> SiH3 + H on the surface. It involves two separate steps: (1) scission of one Si-H bond; (2) formation of two bonds to SiH3 and H from two surface dangling bonds. The energy barrier, which is calculated to be 9 kcal/mol, occurs in the first step at a distance of 3.6 angstrom from the Si in SiH4 to a Si surface atom with a Si-H bond aligned with a surface dangling-bond direction. The overall dissociation process SiH4 --> SiH3 + H on the surface is found to be 2.8 eV exothermic. Quantum tunneling is found to play an important role in the process at room temperature. A symmetrical Eckart potential is used to estimate the quantum tunneling effect and the reaction probability is calculated to be small (on the order of 10(-5)) and relatively insensitive to the silane temperature.
引用
收藏
页码:1741 / 1746
页数:6
相关论文
共 32 条
[1]   REACTIVE STICKING COEFFICIENTS FOR SILANE AND DISILANE ON POLYCRYSTALLINE SILICON [J].
BUSS, RJ ;
HO, P ;
BREILAND, WG ;
COLTRIN, ME .
JOURNAL OF APPLIED PHYSICS, 1988, 63 (08) :2808-2819
[2]  
CHATTOPADHYAY A, 1988, J MOL STRUCT THEOCHE, V163, P63
[3]   THE DEPOSITION OF SILICON FROM SILANE IN A LOW-PRESSURE HOT-WALL SYSTEM [J].
CLAASSEN, WAP ;
BLOEM, J ;
VALKENBURG, WGJN ;
VANDENBREKEL, CHJ .
JOURNAL OF CRYSTAL GROWTH, 1982, 57 (02) :259-266
[4]   CHEMICAL VAPOR-DEPOSITION OF EPITAXIAL SILICON FROM SILANE AT LOW-TEMPERATURES .1. VERY LOW-PRESSURE DEPOSITION [J].
COMFORT, JH ;
REIF, R .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1989, 136 (08) :2386-2398
[5]   THEORETICAL-STUDIES OF INTERSTITIAL HYDROGEN IN TITANIUM [J].
CREMASCHI, P ;
WHITTEN, JL .
SURFACE SCIENCE, 1985, 149 (01) :273-284
[6]   LOW-TEMPERATURE SILICON EPITAXY DEPOSITED BY VERY LOW-PRESSURE CHEMICAL VAPOR-DEPOSITION .1. KINETICS [J].
DONAHUE, TJ ;
REIF, R .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1986, 133 (08) :1691-1697
[7]   Gaussian basis functions for use in molecular calculations. Contraction of (12s9p) atomic basis sets for the second row atoms [J].
Dunning, T. H., Jr. .
CHEMICAL PHYSICS LETTERS, 1970, 7 (04) :423-427
[8]   KINETICS OF SILICON DEPOSITION ON SILICON BY PYROLYSIS OF SILANE - MASS-SPECTROMETRIC INVESTIGATION BY MOLECULAR-BEAM SAMPLING [J].
FARROW, RFC .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1974, 121 (07) :899-907
[9]   DEPOSITION PROPERTIES OF SILICON FILMS FORMED FROM SILANE IN A VERTICAL-FLOW REACTOR [J].
FOSTER, DW ;
LEARN, AJ ;
KAMINS, TI .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1986, 4 (05) :1182-1186
[10]   DECOMPOSITION MECHANISMS OF SIH2, SIH3, AND SIH4 SPECIES ON SI(100)-(2X1) [J].
GATES, SM ;
GREENLIEF, CM ;
BEACH, DB .
JOURNAL OF CHEMICAL PHYSICS, 1990, 93 (10) :7493-7503