共 18 条
[1]
STRUCTURAL-ANALYSIS OF THE NISI2/(111)SI INTERFACE BY THE X-RAY STANDING-WAVE METHOD
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS,
1985, 24 (11)
:1425-1431
[2]
AKIMOTO K, 1987, SURF SCI, V183, pL297, DOI 10.1016/S0039-6028(87)80329-1
[3]
ON THE FORMATION OF SEMICONDUCTOR INTERFACES
[J].
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS,
1987, 20 (02)
:145-175
[6]
SCHOTTKY-BARRIER HEIGHTS OF TRANSITION-METAL-SILICIDE SILICON CONTACTS STUDIED BY X-RAY PHOTOELECTRON-SPECTROSCOPY MEASUREMENTS
[J].
PHYSICAL REVIEW B,
1988, 37 (12)
:6929-6932
[8]
SCHOTTKY CONTACTS TO CLEAVED GAAS (110) SURFACES .1. ELECTRICAL-PROPERTIES AND MICROSCOPIC THEORIES
[J].
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS,
1988, 21 (04)
:783-806
[9]
OBSERVATION OF THE SUPERSTRUCTURE AT THE AL-GAAS(001) INTERFACE BY SYNCHROTRON X-RAY-DIFFRACTION
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1988, 6 (01)
:31-33
[10]
CHEMICAL-REACTION AND ANION TRAPPING AT THE YB/GAAS(110) INTERFACE
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1986, 4 (03)
:808-813