RELATIONSHIP BETWEEN ATOMIC STRUCTURE AND ELECTRONIC PROPERTIES OF (111) SURFACES OF SILICON

被引：68

作者：

ERBUDAK, M

FISCHER, TE

机构：

来源：

PHYSICAL REVIEW LETTERS | 1972年 / 29卷 / 11期

关键词：

D O I：

10.1103/PhysRevLett.29.732

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：732 / &

共 16 条

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[9] SURFACE MEASUREMENTS ON FRESHLY CLEAVED SILICON PARA-NORMAL JUNCTIONS [J].

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[10]

HENZLER M, TO BE PUBLISHED

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