DIRECT METHOD OF MEASURING THE CONTACT INJECTION RATIO

被引：3

作者：

CURTIS, OL

GOSSICK, BR

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1956年 / 27卷 / 10期

关键词：

D O I：

10.1063/1.1715386

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：828 / 829

页数：2

共 17 条

[1] ON OPEN CIRCUIT TRANSIENT EFFECTS IN POINT CONTACT RECTIFIERS [J].

ARMSTRONG, HL .

JOURNAL OF APPLIED PHYSICS, 1956, 27 (04) :420-421

[2] MINORITY CARRIER EXTRACTION IN GERMANIUM [J].

BRAY, R .

PHYSICAL REVIEW, 1955, 100 (04) :1047-1055

[3] POST-INJECTION BARRIER ELECTROMOTIVE FORCE OF P-N JUNCTIONS [J].

GOSSICK, BR .

PHYSICAL REVIEW, 1953, 91 (04) :1012-1013

[4] ON THE TRANSIENT BEHAVIOR OF SEMICONDUCTOR RECTIFIERS [J].

GOSSICK, BR .

JOURNAL OF APPLIED PHYSICS, 1955, 26 (11) :1356-1365

[5] ON THE TRANSIENT BEHAVIOR OF SEMICONDUCTOR RECTIFIERS [J].

GOSSICK, BR .

JOURNAL OF APPLIED PHYSICS, 1956, 27 (08) :905-911

[6]

GOSSICK BR, 1955, P NATL ELECTRON C, V11, P602

[7] TRANSIENT RESPONSE OF A P-N JUNCTION [J].

LAX, B ;

NEUSTADTER, SF .

JOURNAL OF APPLIED PHYSICS, 1954, 25 (09) :1148-1154

[8] MEASUREMENT OF MINORITY CARRIER LIFETIME AND SURFACE EFFECTS IN JUNCTION DEVICES [J].

LEDERHANDLER, SR ;

GIACOLETTO, LJ .

PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1955, 43 (04) :477-483

[9] A PULSE METHOD FOR MEASURING THE INJECTION RATIO OF METAL-SEMICONDUCTOR CONTACTS [J].

LOW, GGE .

PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1955, 68 (07) :447-452

[10] MEASUREMENT OF MINORITY CARRIER LIFETIME AND CONTACT INJECTION RATIO ON TRANSISTOR MATERIALS [J].

MANY, A .

PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1954, 67 (409) :9-17

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