CHARGE STORAGE BY IRRADIATION WITH UV LIGHT IN NON-BIASED MNOS STRUCTURES

被引：11

作者：

JACOBS, EP ^{[1
]}

DORDA, G ^{[1
]}

机构：

[1] SIEMENS AG,FORSCHUNGSLAB,D-8000 MUNICH 80,FED REP GER

来源：

SOLID-STATE ELECTRONICS | 1977年 / 20卷 / 04期

关键词：

D O I：

10.1016/0038-1101(77)90122-8

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：361 / 365

页数：5

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