SUPERIMPOSED PULSE BIAS VOLTAGE USED IN ARC AND SPUTTER TECHNOLOGY

被引:39
作者
OLBRICH, W
KAMPSCHULTE, G
机构
[1] Fraunhofer-Institut für Produktionstechnik und Automatisierung, 7000 Stuttgart 80
关键词
D O I
10.1016/0257-8972(93)90096-7
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The superimposed pulsed bias voltage is composed of a d.c. ground voltage and a higher d.c. pulse voltage. The value of the pulse voltage is comparable with the level which is normally used for etching or sputtering; the ground voltage has the same level as used in conventional processes. Using a superimposed pulsed bias voltage in ion-assisted physical vapour deposition processes effects an additional ion bombardment to the surface with ions of higher energy. Both metal and reactive or neutral gas ions are accelerated to the surface. Basic principles and important characteristics of this newly developed process, such as surface processes and deposition results, are discussed. Because of the pulsing of the high voltage, the deposition temperature does not increase much. Adhesion, microstructure, morphology, internal stresses and film uniformity are influenced by these additional ion impacts. Different films (TiN on steel, copper on silicon or plastics) produced by arc and sputter technology are investigated.
引用
收藏
页码:274 / 280
页数:7
相关论文
共 15 条
[1]   RESIDUAL-STRESS IN ION-ASSISTED COATINGS [J].
BULL, SJ ;
JONES, AM ;
MCCABE, AR .
SURFACE & COATINGS TECHNOLOGY, 1992, 54 (1-3) :173-179
[2]  
HAHN BH, 1989, 1ST P INT C PLASM SU, P1243
[3]   LOW-ENERGY ION IRRADIATION DURING FILM GROWTH FOR REDUCING DEFECT DENSITIES IN EPITAXIAL TIN(100) FILMS DEPOSITED BY REACTIVE-MAGNETRON SPUTTERING [J].
HULTMAN, L ;
HELMERSSON, U ;
BARNETT, SA ;
SUNDGREN, JE ;
GREENE, JE .
JOURNAL OF APPLIED PHYSICS, 1987, 61 (02) :552-555
[4]   REACTIVE ARC VAPOR ION DEPOSITION OF TIN, ZRN AND HFN [J].
JOHANSEN, OA ;
DONTJE, JH ;
ZENNER, RLD .
THIN SOLID FILMS, 1987, 153 :75-82
[5]  
MANN D, 1992, 18TH M EL SOC MET PL, V3, P295
[6]   STRUCTURE MODIFICATION BY ION-BOMBARDMENT DURING DEPOSITION [J].
MATTOX, DM ;
KOMINIAK, GJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1972, 9 (01) :528-&
[7]   REVISED STRUCTURE ZONE MODEL FOR THIN-FILM PHYSICAL STRUCTURE [J].
MESSIER, R ;
GIRI, AP ;
ROY, RA .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1984, 2 (02) :500-503
[8]   ACTIVATED REACTIVE ION PLATING (ARIP) [J].
MOLL, E ;
BUHL, R ;
PULKER, HK ;
BERGMANN, E .
SURFACE & COATINGS TECHNOLOGY, 1989, 39 (1-3) :475-486
[9]  
OLBRICH W, 1992, DUNNE SCHICHTEN, V3, P20
[10]   MICROSTRUCTURE MODIFICATION OF TIN BY ION-BOMBARDMENT DURING REACTIVE SPUTTER DEPOSITION [J].
PETROV, I ;
HULTMAN, L ;
HELMERSSON, U ;
SUNDGREN, JE ;
GREENE, JE .
THIN SOLID FILMS, 1989, 169 (02) :299-314