1.3 mu m photoluminescence from InGaAs quantum dots on GaAs

被引:222
作者
Mirin, RP [1 ]
Ibbetson, JP [1 ]
Nishi, K [1 ]
Gossard, AC [1 ]
Bowers, JE [1 ]
机构
[1] UNIV CALIF SANTA BARBARA,DEPT MAT,SANTA BARBARA,CA 93106
关键词
D O I
10.1063/1.115386
中图分类号
O59 [应用物理学];
学科分类号
摘要
We use molecular beam epitaxy to grown coherently strained InGaAs islands on (100) GaAs substrates. The islands show room-temperature photoluminescence at 1.3 mu m with a full width at half-maximum of only 28 meV. The integrated photoluminescence intensity is comparable to that of a quantum well. The islands are formed by depositing 22 monolayers of In0.3Ga0.7As with alternating beams of In, Ga, and As-2. Atomic force microscopy measurements show that the islands are ellipsoidal sections with an average peak height of 24 nm. The intersection of the islands with the (100) plane is an ellipse whose major axis is along [01(1) over bar] and has a mean length of 54 nm, and whose minor axis is along [011] and has a mean length of 36 nm. The islands form a dense array with an areal coverage of about 40%. (C) 1995 American Institute of Physics.
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页码:3795 / 3797
页数:3
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