EXCIMER LASER-INDUCED MELTING OF HEAVILY DOPED SILICON - A CONTRIBUTION TO THE OPTIMIZATION OF THE LASER DOPING PROCESS

被引:5
作者
FOGARASSY, E
FUCHS, C
DEUNAMUNO, S
SIFFERT, P
机构
关键词
D O I
10.1016/0169-4332(89)90232-8
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
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页码:316 / 320
页数:5
相关论文
共 10 条
[1]  
[Anonymous], 1982, LASER ANNEALING SEMI
[2]   A THERMAL DESCRIPTION OF THE MELTING OF C-SILICON AND A-SILICON UNDER PULSED EXCIMER LASERS [J].
DEUNAMUNO, S ;
FOGARASSY, E .
APPLIED SURFACE SCIENCE, 1989, 36 (1-4) :1-11
[3]   ELECTRICAL-PROPERTIES OF LASER CHEMICALLY DOPED SILICON [J].
DEUTSCH, TF ;
EHRLICH, DJ ;
RATHMAN, DD ;
SILVERSMITH, DJ ;
OSGOOD, RM .
APPLIED PHYSICS LETTERS, 1981, 39 (10) :825-827
[5]  
FOGARASSY E, 1981, J APPL PHYS, V52, P1976
[6]   UV LASER INCORPORATION OF DOPANTS INTO SILICON - COMPARISON OF 2 PROCESSES [J].
FOGARASSY, EP ;
LOWNDES, DH ;
NARAYAN, J ;
WHITE, CW .
JOURNAL OF APPLIED PHYSICS, 1985, 58 (06) :2167-2173
[7]  
PEERCY PS, 1985, MATERIALS RES SOC P, V35, P53
[8]  
SIGMON TW, 1987, MATER RES SOC S P, V75, P619
[9]  
SLAOUI A, 1984, MRS S P, V23, P154
[10]   SOLID SOLUBILITIES OF IMPURITY ELEMENTS IN GERMANIUM AND SILICON [J].
TRUMBORE, FA .
BELL SYSTEM TECHNICAL JOURNAL, 1960, 39 (01) :205-233