EL-4, A NEW-GENERATION ELECTRON-BEAM LITHOGRAPHY SYSTEM

被引:24
作者
PFEIFFER, HC
DAVIS, DE
ENICHEN, WA
GORDON, MS
GROVES, TR
HARTLEY, JG
QUICKLE, RJ
ROCKROHR, JD
STICKEL, W
WEBER, EV
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1993年 / 11卷 / 06期
关键词
D O I
10.1116/1.586982
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The new generation electron-beam lithography system EL-4 is described, designed for direct wafer exposure as well as optical reticle and x-ray mask making. The new architecture features control through workstations and local area network communication between these and the microprocessor-controlled subsystems. The system has on-line error checking and diagnostics. Wafers up to 200 mm diam are handled individually with a Standard Mechanical InterFace-compatible, fully robotic system, and are electrostatically chucked to the stage. Reticles are clamped to the stage with double-sided e/s chucks, ring-bonded membrane masks are kinematically held in a carrier chucked to the stage. The reticle/mask maker has an internal temperature control system in addition to the clean-room climate control for the entire mechanical hardware. The electron optics accommodate triangle as well as rectangle spot formation, and for direct write application a throughput-enhancing third level in the deflection hierarchy. High resolution variable-axis immersion lens optics are used for beam projection and positioning on the target. The column design is significantly advanced over EL-3 for improved integrity and performance as well as automated control through electronics with menu-driven touch screen for user-friendly operation. The first EL-4 system is currently in qualification as a reticle/mask maker for 0.25 mum device technology.
引用
收藏
页码:2332 / 2341
页数:10
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