共 41 条
[4]
COMBINED SCANNING (EBIC) AND TRANSMISSION ELECTRON-MICROSCOPIC INVESTIGATIONS OF DISLOCATIONS IN SEMICONDUCTORS
[J].
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH,
1979, 55 (02)
:611-620
[5]
BOOKER GR, 1981, I PHYS C SER, V60, P203
[6]
BRESSE JF, 1972, 5TH P ANN SEM S, P105
[7]
BRION HG, 1984, 13TH P INT C DEF SEM, P381
[10]
INFLUENCE OF THE GENERATION DISTRIBUTION ON THE CALCULATED EBIC CONTRAST OF LINE DEFECTS
[J].
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH,
1982, 73 (02)
:377-387