MODELING AND MEASUREMENT OF CONTACT RESISTANCES

被引：97

作者：

LOH, WM

SWIRHUN, SE

SCHREYER, TA

SWANSON, RM

SARASWAT, KC

机构：

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1987年 / 34卷 / 03期

关键词：

D O I：

10.1109/T-ED.1987.22957

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：512 / 524

页数：13

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