ELECTRICAL AND OPTICAL CHARACTERIZATION OF METASTABLE DEEP-LEVEL DEFECTS IN GAAS

被引：25

作者：

BUCHWALD, WR

GERARDI, GJ

POINDEXTER, EH

JOHNSON, NM

GRIMMEISS, HG

KEEBLE, DJ

机构：

[1] XEROX CORP,PALO ALTO RES CTR,PALO ALTO,CA 94304

[2] UNIV LUND,DEPT SOLID STATE PHYS,S-22007 LUND 7,SWEDEN

[3] MICHIGAN TECHNOL UNIV,DEPT PHYS,HOUGHTON,MI 49931

来源：

PHYSICAL REVIEW B | 1989年 / 40卷 / 05期

关键词：

D O I：

10.1103/PhysRevB.40.2940

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：2940 / 2945

页数：6

共 26 条

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