We have fabricated and characterized the first Ge(x)Si1-x optical directional couplers. These structures were fabricated from Ge(x)Si1-x grown by rapid thermal processing chemical vapor deposition. The average attenuation of single, straight waveguide sections was 3.3 dB/cm at a wavelength of 1.52-mu-m. For the directional couplers, the coupling coefficient was 3.9 cm-1 for a waveguide separation of 1.5-mu-m.