DIRECT OBSERVATION OF INDIVIDUAL FLUORINE IONS ON A SRF2(111) SURFACE BY ATOMIC FORCE MICROSCOPY

被引：14

作者：

DIETZ, P

RAMOS, CA

HANSMA, PK

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1992年 / 10卷 / 02期

关键词：

D O I：

10.1116/1.586440

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Atomic force microscopy (AFM) was used to image the surface of SrF2(111) with resolution of individual fluorine ions. A SrF2 single crystal was cleaved along the (111) plane and imaged under 0.01 M HCl solution to remove contaminants. In some areas the hexagonal arrangement of the ions is clearly visible with interionic spacings of 3.96 angstrom, which is in good agreement with the crystallographical data. Studies of the epitaxial growth of alkaline earth fluorides on semiconductors may now be possible with AFM.

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页码：741 / 743

页数：3

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