OPTICAL MAPPING OF THE TOTAL EL2-CONCENTRATION IN SEMI-INSULATING GAAS-WAFERS

被引：25

作者：

ZACH, FX

WINNACKER, A

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1989年 / 28卷 / 06期

关键词：

D O I：

10.1143/JJAP.28.957

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：957 / 960

页数：4

共 17 条

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