THE PRESENT AND FUTURE OF HIGH-RESOLUTION ELECTRON-MICROSCOPY

[31] HUMPHREYS CJ, 1981, OPTIK, V58, P125

[32] THE ACCOMMODATION OF MISMATCH AT EPITAXIAL INTERFACES IN SEMICONDUCTORS - SOME CONTRIBUTIONS FROM HREM [J]. ULTRAMICROSCOPY, 1985, 18 (1-4) : 349 - 354

[33] STRUCTURAL INSTABILITY OF ULTRAFINE PARTICLES OF METALS [J]. PHYSICAL REVIEW LETTERS, 1986, 56 (06) : 616 - 619

[34] OBSERVATION OF ATOMIC STEPS OF (111) SURFACE OF A SILICON CRYSTAL USING BRIGHT FIELD ELECTRON-MICROSCOPY [J]. ULTRAMICROSCOPY, 1981, 6 (01) : 41 - 52

[35] SECONDARY-ELECTRON DETECTION IN THE SCANNING-TRANSMISSION ELECTRON-MICROSCOPE [J]. ULTRAMICROSCOPY, 1985, 17 (03) : 243 - 249

[36] ATOMIC IMAGING OF OXIDE SURFACES .2. TERBIUM OXIDE [J]. SURFACE SCIENCE, 1986, 175 (03) : 684 - 692

[37] IMPROVED HIGH-RESOLUTION IMAGE-PROCESSING OF BRIGHT FIELD ELECTRON-MICROGRAPHS .2. EXPERIMENT [J]. ULTRAMICROSCOPY, 1985, 17 (02) : 87 - 103

[38] IMAGE-RECONSTRUCTION USING ELECTRON MICRODIFFRACTION PATTERNS FROM OVERLAPPING REGIONS [J]. ULTRAMICROSCOPY, 1986, 19 (03) : 267 - 277

[39] COMPUTER MODELING OF HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPE IMAGES OF THE (001) AU FILM SURFACE [J]. ULTRAMICROSCOPY, 1979, 4 (01) : 55 - 76

[40] KRIVANEK OL, 1986, ELECTRON MICROS, V1, P519

[31] HUMPHREYS CJ, 1981, OPTIK, V58, P125

[32] THE ACCOMMODATION OF MISMATCH AT EPITAXIAL INTERFACES IN SEMICONDUCTORS - SOME CONTRIBUTIONS FROM HREM [J]. ULTRAMICROSCOPY, 1985, 18 (1-4) : 349 - 354

[33] STRUCTURAL INSTABILITY OF ULTRAFINE PARTICLES OF METALS [J]. PHYSICAL REVIEW LETTERS, 1986, 56 (06) : 616 - 619

[34] OBSERVATION OF ATOMIC STEPS OF (111) SURFACE OF A SILICON CRYSTAL USING BRIGHT FIELD ELECTRON-MICROSCOPY [J]. ULTRAMICROSCOPY, 1981, 6 (01) : 41 - 52

[35] SECONDARY-ELECTRON DETECTION IN THE SCANNING-TRANSMISSION ELECTRON-MICROSCOPE [J]. ULTRAMICROSCOPY, 1985, 17 (03) : 243 - 249

[36] ATOMIC IMAGING OF OXIDE SURFACES .2. TERBIUM OXIDE [J]. SURFACE SCIENCE, 1986, 175 (03) : 684 - 692

[37] IMPROVED HIGH-RESOLUTION IMAGE-PROCESSING OF BRIGHT FIELD ELECTRON-MICROGRAPHS .2. EXPERIMENT [J]. ULTRAMICROSCOPY, 1985, 17 (02) : 87 - 103

[38] IMAGE-RECONSTRUCTION USING ELECTRON MICRODIFFRACTION PATTERNS FROM OVERLAPPING REGIONS [J]. ULTRAMICROSCOPY, 1986, 19 (03) : 267 - 277

[39] COMPUTER MODELING OF HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPE IMAGES OF THE (001) AU FILM SURFACE [J]. ULTRAMICROSCOPY, 1979, 4 (01) : 55 - 76

[40] KRIVANEK OL, 1986, ELECTRON MICROS, V1, P519