共 35 条
[2]
BEEZHOLD W, 1971, AFWLTR69151
[3]
BEEZHOLD W, AD884977L
[7]
GATES DC, 1971, NEUTRON SOURCES APPL, V2, P1
[9]
TRANSIENT ANNEALING OF DEFECTS IN IRRADIATED SILICON DEVICES
[J].
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS,
1970, 58 (09)
:1328-+