ELECTRICAL CHARACTERIZATION OF SEMICONDUCTORS

[51] CAHEN O, 1970, P EUROP C ION IMPLAN, P192

[52] AN AUTOMATIC TEST SET FOR MEASURING DOPING PROFILE OF SEMICONDUCTOR EPITAXIAL LAYERS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1970, 41 (06) : 865 - &

[53] MINORITY-CARRIER RECOMBINATION IN MOS CAPACITORS SWITCHED FROM INVERSION TO ACCUMULATION [J]. SOLID-STATE ELECTRONICS, 1977, 20 (03) : 205 - 212

[54] MEASUREMENT OF CARRIER-CONCENTRATION PROFILES IN EPITAXIAL INDIUM PHOSPHIDE [J]. ELECTRONICS LETTERS, 1973, 9 (04) : 88 - 89

[55] VARIATION OF MINORITY-CARRIER DIFFUSION LENGTH WITH CARRIER CONCENTRATION IN GAAS LIQUID-PHASE EPITAXIAL LAYERS [J]. JOURNAL OF APPLIED PHYSICS, 1973, 44 (03) : 1281 - 1287

[56] CATHODOLUMINESCENT MEASUREMENTS IN GAP (ZN, O) [J]. JOURNAL OF APPLIED PHYSICS, 1971, 42 (07) : 2774 - &

[57] CARRIER MOBILITIES IN SILICON EMPIRICALLY RELATED TO DOPING AND FIELD [J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1967, 55 (12): : 2192 - +

[58] CONTACT SIZE EFFECTS ON VAN VANDERPAUW METHOD FOR RESISTIVITY AND HALL-COEFFICIENT MEASUREMENT [J]. SOLID-STATE ELECTRONICS, 1974, 17 (12) : 1217 - 1227

[59] INFRARED REFLECTIVITY OF ZINC OXIDE [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1959, 11 (3-4) : 190 - 194

[60] COOPER RW, UNPUBLISHED

[51] CAHEN O, 1970, P EUROP C ION IMPLAN, P192

[52] AN AUTOMATIC TEST SET FOR MEASURING DOPING PROFILE OF SEMICONDUCTOR EPITAXIAL LAYERS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1970, 41 (06) : 865 - &

[53] MINORITY-CARRIER RECOMBINATION IN MOS CAPACITORS SWITCHED FROM INVERSION TO ACCUMULATION [J]. SOLID-STATE ELECTRONICS, 1977, 20 (03) : 205 - 212

[54] MEASUREMENT OF CARRIER-CONCENTRATION PROFILES IN EPITAXIAL INDIUM PHOSPHIDE [J]. ELECTRONICS LETTERS, 1973, 9 (04) : 88 - 89

[55] VARIATION OF MINORITY-CARRIER DIFFUSION LENGTH WITH CARRIER CONCENTRATION IN GAAS LIQUID-PHASE EPITAXIAL LAYERS [J]. JOURNAL OF APPLIED PHYSICS, 1973, 44 (03) : 1281 - 1287

[56] CATHODOLUMINESCENT MEASUREMENTS IN GAP (ZN, O) [J]. JOURNAL OF APPLIED PHYSICS, 1971, 42 (07) : 2774 - &

[57] CARRIER MOBILITIES IN SILICON EMPIRICALLY RELATED TO DOPING AND FIELD [J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1967, 55 (12): : 2192 - +

[58] CONTACT SIZE EFFECTS ON VAN VANDERPAUW METHOD FOR RESISTIVITY AND HALL-COEFFICIENT MEASUREMENT [J]. SOLID-STATE ELECTRONICS, 1974, 17 (12) : 1217 - 1227

[59] INFRARED REFLECTIVITY OF ZINC OXIDE [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1959, 11 (3-4) : 190 - 194

[60] COOPER RW, UNPUBLISHED