TRANSIENT ENHANCED DIFFUSION OF ION-IMPLANTED BORON IN SI DURING RAPID THERMAL ANNEALING

被引:46
作者
MIYAKE, M
AOYAMA, S
机构
关键词
D O I
10.1063/1.339914
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:1754 / 1757
页数:4
相关论文
共 11 条
[1]   TRANSIENT ENHANCED DIFFUSION OF DOPANTS IN SILICON INDUCED BY IMPLANTATION DAMAGE [J].
ANGELUCCI, R ;
NEGRINI, P ;
SOLMI, S .
APPLIED PHYSICS LETTERS, 1986, 49 (21) :1468-1470
[2]  
DOUGLAS EC, 1974, IEEE T ELECTRON DEV, VED21, P324, DOI 10.1109/T-ED.1974.17924
[3]   BORON-DIFFUSION IN SILICON-CONCENTRATION AND ORIENTATION DEPENDENCE, BACKGROUND EFFECTS, AND PROFILE ESTIMATION [J].
FAIR, RB .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1975, 122 (06) :800-805
[4]   MODELING RAPID THERMAL-DIFFUSION OF ARSENIC AND BORON IN SILICON [J].
FAIR, RB ;
WORTMAN, JJ ;
LIU, J .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1984, 131 (10) :2387-2394
[5]   DONOR DIFFUSION DYNAMICS IN SILICON [J].
GHOSHTAGORE, RN .
PHYSICAL REVIEW B-SOLID STATE, 1971, 3 (02) :397-+
[6]   RAPID ANNEALING AND THE ANOMALOUS DIFFUSION OF ION-IMPLANTED BORON INTO SILICON [J].
MICHEL, AE ;
RAUSCH, W ;
RONSHEIM, PA ;
KASTL, RH .
APPLIED PHYSICS LETTERS, 1987, 50 (07) :416-418
[7]   DIFFUSION AND SEGREGATION OF LOW-DOSE IMPLANTED BORON IN SILICON UNDER DRY O2 AMBIENT [J].
MIYAKE, M ;
HARADA, H .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1982, 129 (05) :1097-1103
[8]   RAPID THERMAL ANNEALING OF ARSENIC AND BORON-IMPLANTED SILICON [J].
NARAYAN, J ;
HOLLAND, OW ;
EBY, RE ;
WORTMAN, JJ ;
OZGUZ, V ;
ROZGONYI, GA .
APPLIED PHYSICS LETTERS, 1983, 43 (10) :957-959
[9]   TRANSIENT-ENHANCED DIFFUSION DURING FURNACE AND RAPID THERMAL ANNEALING OF ION-IMPLANTED SILICON [J].
PENNYCOOK, SJ ;
NARAYAN, J ;
HOLLAND, OW .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1985, 132 (08) :1962-1968