学术探索
学术期刊
新闻热点
数据分析
智能评审
立即登录
TRANSIENT ENHANCED DIFFUSION OF ION-IMPLANTED BORON IN SI DURING RAPID THERMAL ANNEALING
被引:46
作者
:
MIYAKE, M
论文数:
0
引用数:
0
h-index:
0
MIYAKE, M
AOYAMA, S
论文数:
0
引用数:
0
h-index:
0
AOYAMA, S
机构
:
来源
:
JOURNAL OF APPLIED PHYSICS
|
1988年
/ 63卷
/ 05期
关键词
:
D O I
:
10.1063/1.339914
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:1754 / 1757
页数:4
相关论文
共 11 条
[1]
TRANSIENT ENHANCED DIFFUSION OF DOPANTS IN SILICON INDUCED BY IMPLANTATION DAMAGE
[J].
ANGELUCCI, R
论文数:
0
引用数:
0
h-index:
0
ANGELUCCI, R
;
NEGRINI, P
论文数:
0
引用数:
0
h-index:
0
NEGRINI, P
;
SOLMI, S
论文数:
0
引用数:
0
h-index:
0
SOLMI, S
.
APPLIED PHYSICS LETTERS,
1986,
49
(21)
:1468
-1470
[2]
DOUGLAS EC, 1974, IEEE T ELECTRON DEV, VED21, P324, DOI 10.1109/T-ED.1974.17924
[3]
BORON-DIFFUSION IN SILICON-CONCENTRATION AND ORIENTATION DEPENDENCE, BACKGROUND EFFECTS, AND PROFILE ESTIMATION
[J].
FAIR, RB
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,READING,PA 19603
BELL TEL LABS INC,READING,PA 19603
FAIR, RB
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1975,
122
(06)
:800
-805
[4]
MODELING RAPID THERMAL-DIFFUSION OF ARSENIC AND BORON IN SILICON
[J].
FAIR, RB
论文数:
0
引用数:
0
h-index:
0
机构:
N CAROLINA STATE UNIV,DEPT ELECT ENGN,RALEIGH,NC 27650
N CAROLINA STATE UNIV,DEPT ELECT ENGN,RALEIGH,NC 27650
FAIR, RB
;
WORTMAN, JJ
论文数:
0
引用数:
0
h-index:
0
机构:
N CAROLINA STATE UNIV,DEPT ELECT ENGN,RALEIGH,NC 27650
N CAROLINA STATE UNIV,DEPT ELECT ENGN,RALEIGH,NC 27650
WORTMAN, JJ
;
LIU, J
论文数:
0
引用数:
0
h-index:
0
机构:
N CAROLINA STATE UNIV,DEPT ELECT ENGN,RALEIGH,NC 27650
N CAROLINA STATE UNIV,DEPT ELECT ENGN,RALEIGH,NC 27650
LIU, J
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1984,
131
(10)
:2387
-2394
[5]
DONOR DIFFUSION DYNAMICS IN SILICON
[J].
GHOSHTAGORE, RN
论文数:
0
引用数:
0
h-index:
0
GHOSHTAGORE, RN
.
PHYSICAL REVIEW B-SOLID STATE,
1971,
3
(02)
:397
-+
[6]
RAPID ANNEALING AND THE ANOMALOUS DIFFUSION OF ION-IMPLANTED BORON INTO SILICON
[J].
MICHEL, AE
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,E FISHKILL FACIL,HOPEWELL JUNCTION,NY 12533
IBM CORP,E FISHKILL FACIL,HOPEWELL JUNCTION,NY 12533
MICHEL, AE
;
RAUSCH, W
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,E FISHKILL FACIL,HOPEWELL JUNCTION,NY 12533
IBM CORP,E FISHKILL FACIL,HOPEWELL JUNCTION,NY 12533
RAUSCH, W
;
RONSHEIM, PA
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,E FISHKILL FACIL,HOPEWELL JUNCTION,NY 12533
IBM CORP,E FISHKILL FACIL,HOPEWELL JUNCTION,NY 12533
RONSHEIM, PA
;
KASTL, RH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,E FISHKILL FACIL,HOPEWELL JUNCTION,NY 12533
IBM CORP,E FISHKILL FACIL,HOPEWELL JUNCTION,NY 12533
KASTL, RH
.
APPLIED PHYSICS LETTERS,
1987,
50
(07)
:416
-418
[7]
DIFFUSION AND SEGREGATION OF LOW-DOSE IMPLANTED BORON IN SILICON UNDER DRY O2 AMBIENT
[J].
MIYAKE, M
论文数:
0
引用数:
0
h-index:
0
MIYAKE, M
;
HARADA, H
论文数:
0
引用数:
0
h-index:
0
HARADA, H
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1982,
129
(05)
:1097
-1103
[8]
RAPID THERMAL ANNEALING OF ARSENIC AND BORON-IMPLANTED SILICON
[J].
NARAYAN, J
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB, DIV ANALYT CHEM, OAK RIDGE, TN 37830 USA
NARAYAN, J
;
HOLLAND, OW
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB, DIV ANALYT CHEM, OAK RIDGE, TN 37830 USA
HOLLAND, OW
;
EBY, RE
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB, DIV ANALYT CHEM, OAK RIDGE, TN 37830 USA
EBY, RE
;
WORTMAN, JJ
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB, DIV ANALYT CHEM, OAK RIDGE, TN 37830 USA
WORTMAN, JJ
;
OZGUZ, V
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB, DIV ANALYT CHEM, OAK RIDGE, TN 37830 USA
OZGUZ, V
;
ROZGONYI, GA
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB, DIV ANALYT CHEM, OAK RIDGE, TN 37830 USA
ROZGONYI, GA
.
APPLIED PHYSICS LETTERS,
1983,
43
(10)
:957
-959
[9]
TRANSIENT-ENHANCED DIFFUSION DURING FURNACE AND RAPID THERMAL ANNEALING OF ION-IMPLANTED SILICON
[J].
PENNYCOOK, SJ
论文数:
0
引用数:
0
h-index:
0
PENNYCOOK, SJ
;
NARAYAN, J
论文数:
0
引用数:
0
h-index:
0
NARAYAN, J
;
HOLLAND, OW
论文数:
0
引用数:
0
h-index:
0
HOLLAND, OW
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1985,
132
(08)
:1962
-1968
[10]
THEORETICAL CALCULATIONS OF THE ENTHALPIES AND ENTROPIES OF DIFFUSION AND VACANCY FORMATION IN SEMICONDUCTORS
[J].
SWALIN, RA
论文数:
0
引用数:
0
h-index:
0
SWALIN, RA
.
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS,
1961,
18
(04)
:290
-296
←
1
2
→
共 11 条
[1]
TRANSIENT ENHANCED DIFFUSION OF DOPANTS IN SILICON INDUCED BY IMPLANTATION DAMAGE
[J].
ANGELUCCI, R
论文数:
0
引用数:
0
h-index:
0
ANGELUCCI, R
;
NEGRINI, P
论文数:
0
引用数:
0
h-index:
0
NEGRINI, P
;
SOLMI, S
论文数:
0
引用数:
0
h-index:
0
SOLMI, S
.
APPLIED PHYSICS LETTERS,
1986,
49
(21)
:1468
-1470
[2]
DOUGLAS EC, 1974, IEEE T ELECTRON DEV, VED21, P324, DOI 10.1109/T-ED.1974.17924
[3]
BORON-DIFFUSION IN SILICON-CONCENTRATION AND ORIENTATION DEPENDENCE, BACKGROUND EFFECTS, AND PROFILE ESTIMATION
[J].
FAIR, RB
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,READING,PA 19603
BELL TEL LABS INC,READING,PA 19603
FAIR, RB
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1975,
122
(06)
:800
-805
[4]
MODELING RAPID THERMAL-DIFFUSION OF ARSENIC AND BORON IN SILICON
[J].
FAIR, RB
论文数:
0
引用数:
0
h-index:
0
机构:
N CAROLINA STATE UNIV,DEPT ELECT ENGN,RALEIGH,NC 27650
N CAROLINA STATE UNIV,DEPT ELECT ENGN,RALEIGH,NC 27650
FAIR, RB
;
WORTMAN, JJ
论文数:
0
引用数:
0
h-index:
0
机构:
N CAROLINA STATE UNIV,DEPT ELECT ENGN,RALEIGH,NC 27650
N CAROLINA STATE UNIV,DEPT ELECT ENGN,RALEIGH,NC 27650
WORTMAN, JJ
;
LIU, J
论文数:
0
引用数:
0
h-index:
0
机构:
N CAROLINA STATE UNIV,DEPT ELECT ENGN,RALEIGH,NC 27650
N CAROLINA STATE UNIV,DEPT ELECT ENGN,RALEIGH,NC 27650
LIU, J
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1984,
131
(10)
:2387
-2394
[5]
DONOR DIFFUSION DYNAMICS IN SILICON
[J].
GHOSHTAGORE, RN
论文数:
0
引用数:
0
h-index:
0
GHOSHTAGORE, RN
.
PHYSICAL REVIEW B-SOLID STATE,
1971,
3
(02)
:397
-+
[6]
RAPID ANNEALING AND THE ANOMALOUS DIFFUSION OF ION-IMPLANTED BORON INTO SILICON
[J].
MICHEL, AE
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,E FISHKILL FACIL,HOPEWELL JUNCTION,NY 12533
IBM CORP,E FISHKILL FACIL,HOPEWELL JUNCTION,NY 12533
MICHEL, AE
;
RAUSCH, W
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,E FISHKILL FACIL,HOPEWELL JUNCTION,NY 12533
IBM CORP,E FISHKILL FACIL,HOPEWELL JUNCTION,NY 12533
RAUSCH, W
;
RONSHEIM, PA
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,E FISHKILL FACIL,HOPEWELL JUNCTION,NY 12533
IBM CORP,E FISHKILL FACIL,HOPEWELL JUNCTION,NY 12533
RONSHEIM, PA
;
KASTL, RH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,E FISHKILL FACIL,HOPEWELL JUNCTION,NY 12533
IBM CORP,E FISHKILL FACIL,HOPEWELL JUNCTION,NY 12533
KASTL, RH
.
APPLIED PHYSICS LETTERS,
1987,
50
(07)
:416
-418
[7]
DIFFUSION AND SEGREGATION OF LOW-DOSE IMPLANTED BORON IN SILICON UNDER DRY O2 AMBIENT
[J].
MIYAKE, M
论文数:
0
引用数:
0
h-index:
0
MIYAKE, M
;
HARADA, H
论文数:
0
引用数:
0
h-index:
0
HARADA, H
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1982,
129
(05)
:1097
-1103
[8]
RAPID THERMAL ANNEALING OF ARSENIC AND BORON-IMPLANTED SILICON
[J].
NARAYAN, J
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB, DIV ANALYT CHEM, OAK RIDGE, TN 37830 USA
NARAYAN, J
;
HOLLAND, OW
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB, DIV ANALYT CHEM, OAK RIDGE, TN 37830 USA
HOLLAND, OW
;
EBY, RE
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB, DIV ANALYT CHEM, OAK RIDGE, TN 37830 USA
EBY, RE
;
WORTMAN, JJ
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB, DIV ANALYT CHEM, OAK RIDGE, TN 37830 USA
WORTMAN, JJ
;
OZGUZ, V
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB, DIV ANALYT CHEM, OAK RIDGE, TN 37830 USA
OZGUZ, V
;
ROZGONYI, GA
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB, DIV ANALYT CHEM, OAK RIDGE, TN 37830 USA
ROZGONYI, GA
.
APPLIED PHYSICS LETTERS,
1983,
43
(10)
:957
-959
[9]
TRANSIENT-ENHANCED DIFFUSION DURING FURNACE AND RAPID THERMAL ANNEALING OF ION-IMPLANTED SILICON
[J].
PENNYCOOK, SJ
论文数:
0
引用数:
0
h-index:
0
PENNYCOOK, SJ
;
NARAYAN, J
论文数:
0
引用数:
0
h-index:
0
NARAYAN, J
;
HOLLAND, OW
论文数:
0
引用数:
0
h-index:
0
HOLLAND, OW
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1985,
132
(08)
:1962
-1968
[10]
THEORETICAL CALCULATIONS OF THE ENTHALPIES AND ENTROPIES OF DIFFUSION AND VACANCY FORMATION IN SEMICONDUCTORS
[J].
SWALIN, RA
论文数:
0
引用数:
0
h-index:
0
SWALIN, RA
.
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS,
1961,
18
(04)
:290
-296
←
1
2
→