HIGHLY BERYLLIUM-DOPED AND LATTICE-MATCHED GAINASP/INP GROWTH BY CHEMICAL BEAM EPITAXY (CBE)

被引:5
作者
UCHIDA, TK
UCHIDA, T
MISE, K
KOYAMA, F
IGA, K
机构
[1] Research Laboratory of Precision Machinery and Electronics, Tokyo Institute of Technology, Midori-ku, Yokohama, 227
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1990年 / 29卷 / 03期
关键词
GalnAsP/InP growth by chemical beam epitax;
D O I
10.1143/JJAP.29.562
中图分类号
O59 [应用物理学];
学科分类号
摘要
Highly Be-doped (>1019 cm-3) 1.45 µm-wavelength GaInAsP was grown by chemical beam epitaxy with a solid Be source. The hole concentration for both GaInAsP and InP was linearly related to the Be effusion cell temperature. In spite of high doping levels, neither obvious lattice mismatch nor surface degradation was observed. A stripe contact laser was also successfully fabricated using the results obtained. © 1990 The Japan Society of Applied Physics.
引用
收藏
页码:562 / 563
页数:2
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