SIMULATION OF CHARGE TRANSPORT AND TRAPPING IN MIS STRUCTURES WITH TRIPLE-LAYER DIELECTRICS

被引：5

作者：

BAUNACH, R ^{[1
]}

SPITZER, A ^{[1
]}

机构：

[1] SIEMENS AG,D-8000 MUNICH 83,FED REP GER

来源：

APPLIED SURFACE SCIENCE | 1989年 / 39卷 / 1-4期

关键词：

D O I：

10.1016/0169-4332(89)90434-0

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：200 / 209

页数：10

共 15 条

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