GROWTH OF COBALT AND COBALT DISILICIDE ON SI(100)

被引:52
作者
GALLEGO, JM [1 ]
MIRANDA, R [1 ]
MOLODTSOV, S [1 ]
LAUBSCHAT, C [1 ]
KAINDL, G [1 ]
机构
[1] FREE UNIV BERLIN,INST ATOM & FESTKORPERPHYS,W-1000 BERLIN 33,GERMANY
关键词
D O I
10.1016/0039-6028(90)90222-T
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The growth of Co on Si(100) and the initial stages of the formation of cobalt silicides have been studied by means of a multitechnique approach. Adsorption of Co on Si(100) at room temperature does not result in reaction and formation of a few ML-thick CoSi2 overlayer, contrary to adsorption on (111) surfaces. Rather, a layer-by-layer growth of metallic Co with some Si interdiffused is observed. The formation of CoSi2 requires annealing to 350-degrees-C, a temperature much lower than in the (111) surface. Annealing to 600-degrees-C results in additional Si-enrichment at the surface produced by disruption of the CoSi2 overlayer. The thin CoSi2 "template" layer, which is crucial to achieve epitaxial growth, contains Si at the outer surface, as demonstrated by chemical titration.
引用
收藏
页码:203 / 212
页数:10
相关论文
共 36 条
[1]   ADSORBED LAYER AND THIN-FILM GROWTH MODES MONITORED BY AUGER-ELECTRON SPECTROSCOPY [J].
ARGILE, C ;
RHEAD, GE .
SURFACE SCIENCE REPORTS, 1989, 10 (6-7) :277-356
[2]   SILICON METAL SILICIDE HETEROSTRUCTURES GROWN BY MOLECULAR-BEAM EPITAXY [J].
BEAN, JC ;
POATE, JM .
APPLIED PHYSICS LETTERS, 1980, 37 (07) :643-646
[3]   HIGH-RESOLUTION PHOTOEMISSION-STUDY OF CO/SI(111) INTERFACE FORMATION [J].
BOSCHERINI, F ;
JOYCE, JJ ;
RUCKMAN, MW ;
WEAVER, JH .
PHYSICAL REVIEW B, 1987, 35 (09) :4216-4220
[4]   OXYGEN INTERACTION WITH COSI(100) AND COSI2(100) SURFACES [J].
CASTRO, G ;
HULSE, JE ;
KUPPERS, J ;
GONZALEZELIPE, AR .
SURFACE SCIENCE, 1982, 117 (1-3) :621-628
[5]   HIGH-TEMPERATURE NUCLEATION AND SILICIDE FORMATION AT THE CO/SI(111)-7X7 INTERFACE - A STRUCTURAL INVESTIGATION [J].
CHAMBERS, SA ;
ANDERSON, SB ;
CHEN, HW ;
WEAVER, JH .
PHYSICAL REVIEW B, 1986, 34 (02) :913-920
[6]   EXPERIMENTAL AND THEORETICAL-STUDY OF CO ADSORBED AT THE SURFACE OF CU - RECONSTRUCTIONS, CHARGE-DENSITY WAVES, SURFACE MAGNETISM, AND OXYGEN-ADSORPTION [J].
GONZALEZ, L ;
MIRANDA, R ;
SALMERON, M ;
VERGES, JA ;
YNDURAIN, F .
PHYSICAL REVIEW B, 1981, 24 (06) :3245-3254
[7]   EPITAXY OF COSI2 ON SI (111) AT LOW-TEMPERATURE (LESS-THAN-OR-EQUAL-TO 400-DEGREES-C) [J].
HADERBACHE, L ;
WETZEL, P ;
PIRRI, C ;
PERUCHETTI, JC ;
BOLMONT, D ;
GEWINNER, G .
APPLIED PHYSICS LETTERS, 1988, 53 (15) :1384-1386
[8]   SURFACE-STRUCTURE OF THIN EPITAXIAL COSI2 GROWN ON SI(111) [J].
HELLMAN, F ;
TUNG, RT .
PHYSICAL REVIEW B, 1988, 37 (18) :10786-10794
[9]   GROWTH AND CHARACTERIZATION OF METAL-SEMICONDUCTOR SUPERLATTICES [J].
HENZ, J ;
OSPELT, M ;
VONKANEL, H .
SURFACE SCIENCE, 1989, 211 (1-3) :716-723
[10]   GEOMETRY-DEPENDENT SI(2P) SURFACE CORE-LEVEL EXCITATIONS FOR SI(111) AND SI(100) SURFACES [J].
HIMPSEL, FJ ;
HEIMANN, P ;
CHIANG, TC ;
EASTMAN, DE .
PHYSICAL REVIEW LETTERS, 1980, 45 (13) :1112-1115