THE USE OF DISPOSABLE DOUBLE SPACER AND SELF-ALIGNED COBALT SILICIDE FOR LDD MOSFET FABRICATION

被引:7
作者
RONKAINEN, H
DROZDY, G
FRANSSILA, S
机构
[1] Semiconductor Laboratory, Technical Research Centre of Finland
关键词
D O I
10.1109/55.75732
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A novel type of LDD MOSFET with an optional self-aligned silicide metallization is presented. A disposable double spacer of silicon nitride/amorphous silicon is used to enable LDD MOSFET's to be fabricated with just two masking steps compared to four in the conventional oxide spacer LDD FET. The alpha-Si spacer is disposed after is has been used to pattern the nitride. The nitride acts as a second spacer to block low-energy S/D implants and to shift LDD implants away from the gate edge. Self-aligned metallization can be realized using the nitride as silidication barrier.
引用
收藏
页码:125 / 127
页数:3
相关论文
共 9 条
[1]   APPLICATION OF SELF-ALIGNED COSI2 INTERCONNECTION IN SUBMICROMETER CMOS TRANSISTORS [J].
BROADBENT, EK ;
IRANI, RF ;
MORGAN, AE ;
MAILLOT, P .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1989, 36 (11) :2440-2446
[2]   FORMATION OF COSI2 ON AMORPHOUS-SILICON BY RTA [J].
DROZDY, G ;
RONKAINEN, H ;
SUNI, I .
APPLIED SURFACE SCIENCE, 1989, 38 (1-4) :72-79
[3]  
DROZDY G, 1988, 13TH P NORD SEM M ST, P49
[4]  
FRANSSILA S, 1990, 8TH P S PLASM PROC, P689
[5]   SUBMICROMETER SALICIDE CMOS DEVICES WITH SELF-ALIGNED SHALLOW DEEP JUNCTIONS [J].
LU, CY ;
SUNG, JJ ;
YU, CHD .
IEEE ELECTRON DEVICE LETTERS, 1989, 10 (11) :487-489
[6]   LDD MOSFETS USING DISPOSABLE SIDEWALL SPACER TECHNOLOGY [J].
PFIESTER, JR .
IEEE ELECTRON DEVICE LETTERS, 1988, 9 (04) :189-192
[7]   A POLYFRAMED LDD SUB-HALF-MICROMETER CMOS TECHNOLOGY [J].
PFIESTER, JR ;
CRAIN, N ;
LIN, JH ;
GUNDERSON, CD ;
KAUSHIK, V .
IEEE ELECTRON DEVICE LETTERS, 1990, 11 (11) :529-531
[8]   LIMITATION OF SPACER THICKNESS IN TITANIUM SALICIDE ULSI CMOS TECHNOLOGY [J].
SUNG, JJ ;
LU, CY .
IEEE ELECTRON DEVICE LETTERS, 1989, 10 (11) :481-483
[9]  
YING CY, 1988, 173RD EL SOC M, P207