ION SPECIES DEPENDENCE OF FOCUSED-ION-BEAM LITHOGRAPHY

被引:16
作者
MATSUI, S [1 ]
MORI, K [1 ]
SHIOKAWA, T [1 ]
TOYODA, K [1 ]
NAMBA, S [1 ]
机构
[1] INST PHYS & CHEM RES,WAKO,SAITAMA 351,JAPAN
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1987年 / 5卷 / 04期
关键词
D O I
10.1116/1.583679
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:853 / 857
页数:5
相关论文
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