Highly repetitive, extreme-ultraviolet radiation source based on a gas-discharge plasma

被引:112
作者
Bergmann, K
Schriever, G
Rosier, O
Muller, M
Neff, W
Lebert, R
机构
[1] Rhein Westfal TH Aachen, Lehrstuhl Lasertech, D-52074 Aachen, Germany
[2] Fraunhofer Inst Lasertech, D-52074 Aachen, Germany
关键词
D O I
10.1364/AO.38.005413
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
An extreme-ultraviolet (EUV) radiation source near the 13-nm wavelength generated in a small (1.1 J) pinch plasma is presented. The ignition of the plasma occurs in a pseudosparklike electrode geometry, which allows for omitting a switch between the storage capacity and the electrode system and for low inductive coupling of the electrically stored energy to the plasma. Thus energies of only a few joules are sufficient to create current pulses in the range of several kiloamperes, which lead to a compression and a heating of the plasmas to electron densities of more than 10(17) cm(-3) and temperatures of several tens of electron volts, which is necessary for emission in the EUV range. As an example, the emission spectrum of an oxygen plasma in the 11-18-nm range is presented. Transitions of beryllium- and lithium-like oxygen ions can be identified. Current waveform and time-resolved measurements of the EUV emission are discussed. In initial experiments a repetitive operation at nearly 0.2 kHz could be demonstrated. Additionally, the broadband emission of a xenon plasma generated in a 2.2-J discharge is presented. (C) 1999 Optical Society of America.
引用
收藏
页码:5413 / 5417
页数:5
相关论文
共 18 条
[1]   REDUCTION IMAGING AT 14 NM USING MULTILAYER-COATED OPTICS - PRINTING OF FEATURES SMALLER THAN 0.1-MU-M [J].
BJORKHOLM, JE ;
BOKOR, J ;
EICHNER, L ;
FREEMAN, RR ;
GREGUS, J ;
JEWELL, TE ;
MANSFIELD, WM ;
MACDOWELL, AA ;
RAAB, EL ;
SILFVAST, WT ;
SZETO, LH ;
TENNANT, DM ;
WASKIEWICZ, WK ;
WHITE, DL ;
WINDT, DL ;
WOOD, OR ;
BRUNING, JH .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1990, 8 (06) :1509-1513
[2]   SPECTRA OF XE-VII, XE-VIII, AND XE-IX IN THE EXTREME ULTRAVIOLET - 4D-MP, NF TRANSITIONS [J].
BLACKBURN, J ;
CARROLL, PK ;
COSTELLO, J ;
OSULLIVAN, G .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1983, 73 (10) :1325-1329
[3]   PSEUDOSPARK DISCHARGES VIA COMPUTER-SIMULATION [J].
BOEUF, JP ;
PITCHFORD, LC .
IEEE TRANSACTIONS ON PLASMA SCIENCE, 1991, 19 (02) :286-296
[4]   WAVELENGTH CONSIDERATIONS IN SOFT-X-RAY PROJECTION LITHOGRAPHY [J].
HAWRYLUK, AM ;
CEGLIO, NM .
APPLIED OPTICS, 1993, 32 (34) :7062-7067
[5]  
HOUSE LL, 1964, ASTROPHYS J S7, V81, P307
[6]   ANALYSIS OF THE 4D9-4D85P TRANSITIONS IN 9-TIMES IONIZED XENON (XE X) [J].
KAUFMAN, V ;
SUGAR, J ;
TECH, JL .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1983, 73 (05) :691-693
[7]   Intense xenon capillary discharge extreme-ultraviolet source in the 10-16-nm-wavelength region [J].
Klosner, MA ;
Silfvast, WT .
OPTICS LETTERS, 1998, 23 (20) :1609-1611
[8]   Intense plasma discharge source at 13.5 nm for extreme-ultraviolet lithography [J].
Klosner, MA ;
Bender, HA ;
Silfvast, WT ;
Rocca, JJ .
OPTICS LETTERS, 1997, 22 (01) :34-36
[9]   STUDY OF THE BREAKDOWN PHASE IN A PSEUDOSPARK SWITCH .1. BASIS EXPERIMENTS AND CRUDE MODEL [J].
LARIGALDIE, S .
IEEE TRANSACTIONS ON PLASMA SCIENCE, 1995, 23 (03) :362-368
[10]   MULTILAYER COATED REFLECTIVE OPTICS FOR EXTREME UV LITHOGRAPHY [J].
LOUIS, E ;
VOORMA, HJ ;
KOSTER, NB ;
BIJKERK, F ;
PLATONOV, YY ;
ZUEV, SY ;
ANDREEV, SS ;
SHAMOV, EA ;
SALASHCHENKO, NN .
MICROELECTRONIC ENGINEERING, 1995, 27 (1-4) :235-238