COMPLEX-REFRACTIVE-INDEX PROFILES OF 4-MEV GE ION-IRRADIATION DAMAGE IN SILICON

被引：47

作者：

HEIDEMANN, KF

机构：

来源：

PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 1981年 / 44卷 / 04期

关键词：

D O I：

10.1080/01418638108222583

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：465 / 485

页数：21

共 32 条

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