LOW-TEMPERATURE GROWTH OF (CD,HG)TE LAYERS BY MOVPE

被引:8
作者
DESJONQUERES, F [1 ]
TROMSONCARLI, A [1 ]
CHEUVART, P [1 ]
DRUILHE, R [1 ]
GRATTEPAIN, C [1 ]
KATTY, A [1 ]
MARFAING, Y [1 ]
TRIBOULET, R [1 ]
LORANS, D [1 ]
机构
[1] SOC ANONYME TELECOMMUN,F-75624 PARIS,FRANCE
关键词
D O I
10.1016/0022-0248(91)90531-9
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
MCT layers have been grown for the first time at 250-degrees-C using DATe, DMCd and mercury. First the buffer layer CdTe grown at 365-degrees-C using DIPTe and DMCd is studied with an emphasis on the influence of the substrate orientation. Indeed the surface morphology and the crystalline quality may change dramatically as a function of the substrate orientation. Then the low temperature MOVPE growth of (Cd,Hg)Te is described: different compositions were achieved and the crystalline and electronic properties are presented.
引用
收藏
页码:626 / 631
页数:6
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