AB-INITIO CALCULATION OF G-VALUES OF ESR CENTERS IN ALPHA-SI-H BY CLUSTER-MODELS

被引:7
作者
KATAGIRI, H
机构
[1] Electrotechnical Laboratory, Tsukuba City, Ibaraki, 305
关键词
SEMICONDUCTORS; POINT DEFECTS; ELECTRONIC STATES;
D O I
10.1016/0038-1098(95)00236-7
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
ESR centers in several silicon clusters are calculated by the ab initio molecular orbital method using perturbation theory. Dangling bonds (D-0) are modeled by clusters with 4-22 silicon atoms. The calculated g-values for the dangling bonds due to a hole or an electron with a Si-Si bond, and charged dangling bonds (D+ + e(-), D- + h) are also modeled by 4-20 silicon atoms, and their g-values are also compared with ESR measurements of doped a-Si:H and LESR measurements of undoped a-Si:H. It is shown that the charged bond model is consistent with experimental results.
引用
收藏
页码:143 / 147
页数:5
相关论文
共 25 条
[1]   DEFECTS IN AMORPHOUS CHALCOGENIDES AND SILICON [J].
ADLER, D .
JOURNAL DE PHYSIQUE, 1981, 42 (NC4) :3-14
[2]   CORRELATION-ENERGY OF DEEP LEVEL TRAPS IN A-SI-H [J].
BARYAM, Y ;
JOANNOPOULOS, JD .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1985, 77-8 :99-102
[3]  
BARYAM Y, 1985, J NONCRYST SOLIDS, V78
[4]   HYPERFINE STUDIES OF DANGLING BONDS IN AMORPHOUS-SILICON [J].
BIEGELSEN, DK ;
STUTZMANN, M .
PHYSICAL REVIEW B, 1986, 33 (05) :3006-3011
[5]  
GIANOLIO L, 1980, GAZZ CHIM ITAL, V110, P179
[6]  
Huber K. P., 1979, MOL SPECTRA MOL STRU
[7]  
Huzinaga S., 1984, GAUSSIAN BASIS SETS, V16
[8]   THE G-VALUES OF DEFECTS IN AMORPHOUS C, SI AND GE [J].
ISHII, N ;
KUMEDA, M ;
SHIMIZU, T .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1981, 20 (09) :L673-L676
[9]   DEFECT STATES IN AMORPHOUS-SILICON [J].
ISHII, N ;
KUMEDA, M ;
SHIMIZU, T .
PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1983, 116 (01) :91-100
[10]   CORRECTION [J].
ISHII, N .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1981, 20 (12) :L920-L920