共 70 条
[2]
SINGLE EVENT ERROR IMMUNE CMOS RAM
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1982, 29 (06)
:2040-2043
[3]
AONO K, 1986, I PHYS C SER, V83, P527
[4]
AUKERMAN LW, 1968, SEMICONDUCT SEMIMET, V4, pCH4
[10]
COMPARISON OF NEUTRON RADIATION TOLERANCE OF BIPOLAR AND JUNCTION FIELD EFFECT TRANSISTORS
[J].
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS,
1967, 55 (12)
:2188-+