DETERMINING OPTICAL-PROPERTIES OF THIN-FILMS BY MODIFIED ATTENUATED TOTAL REFLECTION WITH A CHARGE COUPLED DEVICE

被引：14

作者：

WILSON, PW

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1988年 / 6卷 / 04期

关键词：

D O I：

10.1116/1.575560

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：2386 / 2389

页数：4

共 27 条

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[12]

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[14]

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[17] OPTIMUM CONDITIONS IN THE ATTENUATED TOTAL REFLECTION TECHNIQUE [J].

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APPLIED OPTICS, 1981, 20 (06) :1005-1010

[18] USE OF A TOTAL ABSORPTION ATR METHOD TO MEASURE COMPLEX REFRACTIVE-INDEXES OF METAL-FOILS [J].

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JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1980, 70 (12) :1507-1513

[19] ATR METHOD WITH FOCUSED LIGHT - APPLICATION TO GUIDED WAVES ON A GRATING [J].

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[20]

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