COMPARISON OF MOS CAPACITOR AND TRANSISTOR POSTIRRADIATION RESPONSE

被引:32
作者
MCWHORTER, PJ
FLEETWOOD, DM
PASTOREK, RA
ZIMMERMAN, GT
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关键词
D O I
10.1109/23.45371
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:1792 / 1799
页数:8
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共 19 条
[1]   THE APPLICATION OF DEEP LEVEL TRANSIENT SPECTROSCOPY TO THE MEASUREMENT OF RADIATION-INDUCED INTERFACE STATE SPECTRA [J].
BARNES, C ;
ZIETLOW, T ;
NAKAMURA, K .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1988, 35 (06) :1197-1202
[2]   SURFACE STATES AT STEAM-GROWN SILICON-SILICON DIOXIDE INTERFACES [J].
BERGLUND, CN .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1966, ED13 (10) :701-+
[3]   DESCRIPTION OF SIO2-SI INTERFACE PROPERTIES BY MEANS OF VERY LOW FREQUENCY MOS CAPACITANCE MEASUREMENTS [J].
CASTAGNE, R ;
VAPAILLE, A .
SURFACE SCIENCE, 1971, 28 (01) :157-+
[4]   THE RESPONSE OF MOS DEVICES TO DOSE-ENHANCED LOW-ENERGY RADIATION [J].
FLEETWOOD, DM ;
WINOKUR, PS ;
LORENCE, LJ ;
BEEZHOLD, W ;
DRESSENDORFER, PV ;
SCHWANK, JR .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1986, 33 (06) :1245-1251
[5]   A REEVALUATION OF WORST-CASE POSTIRRADIATION RESPONSE FOR HARDENED MOS-TRANSISTORS [J].
FLEETWOOD, DM ;
DRESSENDORFER, PV ;
TURPIN, DC .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1987, 34 (06) :1178-1183
[6]   A RELIABLE APPROACH TO CHARGE-PUMPING MEASUREMENTS IN MOS-TRANSISTORS [J].
GROESENEKEN, G ;
MAES, HE ;
BELTRAN, N ;
DEKEERSMAECKER, RF .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1984, 31 (01) :42-53
[7]   HOLE TRAPS AND TRIVALENT SILICON CENTERS IN METAL-OXIDE SILICON DEVICES [J].
LENAHAN, PM ;
DRESSENDORFER, PV .
JOURNAL OF APPLIED PHYSICS, 1984, 55 (10) :3495-3499
[8]   COMPARISON OF INTERFACE-STATE GENERATION BY 25-KEV ELECTRON-BEAM IRRADIATION IN P-TYPE AND N-TYPE MOS CAPACITORS [J].
MA, TP ;
SCOGGAN, G ;
LEONE, R .
APPLIED PHYSICS LETTERS, 1975, 27 (02) :61-63
[9]   SIMPLE TECHNIQUE FOR SEPARATING THE EFFECTS OF INTERFACE TRAPS AND TRAPPED-OXIDE CHARGE IN METAL-OXIDE-SEMICONDUCTOR TRANSISTORS [J].
MCWHORTER, PJ ;
WINOKUR, PS .
APPLIED PHYSICS LETTERS, 1986, 48 (02) :133-135
[10]  
NICOLLIAN EH, 1967, BELL SYST TECH J, V46, P1095