DIRECT MEASUREMENT OF HOT ELECTRON-PHONON INTERACTIONS IN GAP

被引：40

作者：

WILLIAMS, BF

SIMON, RE

机构：

来源：

关键词：

D O I：

10.1103/PhysRevLett.18.485

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：485 / &

共 7 条

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[2] HOT-ELECTRON EMISSION FROM SHALLO P-N JUNCTIONS IN SILICON
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[4] PHOTOELECTRIC EMISSION AND INTERBAND TRANSITIONS OF GAP
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[J]. PHYSICAL REVIEW, 1966, 147 (02): : 603 - &
[5] SIMPLE MODEL FOR COLLISION EFFECTS IN PHOTOEMISSION
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[J]. PHYSICAL REVIEW, 1966, 147 (01): : 335 - &
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[J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (05) : 1649 - &
[7] GAP SURFACE-BARRIER DIODES
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LOGAN, RA
[J]. JOURNAL OF APPLIED PHYSICS, 1963, 34 (07) : 1990 - &