DIVACANCY IN SILICON - HYPERFINE INTERACTIONS FROM ELECTRON-NUCLEAR DOUBLE-RESONANCE MEASUREMENTS .2.

被引：46

作者：

SIEVERTS, EG ^{[1
]}

MULLER, SH ^{[1
]}

AMMERLAAN, CAJ ^{[1
]}

机构：

[1] UNIV AMSTERDAM,NATUURKUNDIG LAB,AMSTERDAM 1004,NETHERLANDS

来源：

PHYSICAL REVIEW B | 1978年 / 18卷 / 12期

关键词：

D O I：

10.1103/PhysRevB.18.6834

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：6834 / 6848

页数：15

共 38 条

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[10]

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