DIFFUSION OF NICKEL IN SILICON BELOW 475-DEGREES-C

[1] THE SOLID SOLUBILITY OF NICKEL IN SILICON DETERMINED BY NEUTRON ACTIVATION ANALYSIS [J]. APPLIED PHYSICS LETTERS, 1962, 1 (01) : 19 - 20

[2] OBSERVATION OF PSEUDO-DIFFUSION OF NICKEL IN SINGLE-CRYSTAL SILICON BY IN-DEPTH AUGER-ELECTRON SPECTROSCOPY [J]. THIN SOLID FILMS, 1977, 45 (01) : 141 - 145

[3] DIFFUSION OF NICKEL IN SILICON [J]. PHYSICA STATUS SOLIDI, 1967, 20 (02): : 493 - &

[4] CHANG CC, 1974, CHARACTERIZATION SOL

[5] IDENTIFICATION OF DOMINANT DIFFUSING SPECIES IN SILICIDE FORMATION [J]. APPLIED PHYSICS LETTERS, 1974, 25 (08) : 454 - 457

[6] PLATINUM SILICIDE FORMATION - ELECTRON-SPECTROSCOPY OF PLATINUM-PLATINUM SILICIDE INTERFACE [J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (12) : 5141 - 5144

[7] FORMALISM FOR EXTRACTING DIFFUSION-COEFFICIENTS FROM CONCENTRATION PROFILES [J]. SURFACE SCIENCE, 1976, 54 (01) : 79 - 90

[8] SOLID-SOLID REACTIONS IN PT-SI SYSTEMS [J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (06) : 2913 - +

[9] INFLUENCE OF NATURE OF SI SUBSTRATE ON NICKEL SILICIDE FORMED FROM THIN NI FILMS [J]. THIN SOLID FILMS, 1976, 38 (02) : 143 - 150

[10] KINETICS AND MECHANISM OF PLATINUM SILICIDE FORMATION ON SILICON [J]. APPLIED PHYSICS LETTERS, 1974, 24 (08) : 391 - 393

[1] THE SOLID SOLUBILITY OF NICKEL IN SILICON DETERMINED BY NEUTRON ACTIVATION ANALYSIS [J]. APPLIED PHYSICS LETTERS, 1962, 1 (01) : 19 - 20

[2] OBSERVATION OF PSEUDO-DIFFUSION OF NICKEL IN SINGLE-CRYSTAL SILICON BY IN-DEPTH AUGER-ELECTRON SPECTROSCOPY [J]. THIN SOLID FILMS, 1977, 45 (01) : 141 - 145

[3] DIFFUSION OF NICKEL IN SILICON [J]. PHYSICA STATUS SOLIDI, 1967, 20 (02): : 493 - &

[4] CHANG CC, 1974, CHARACTERIZATION SOL

[5] IDENTIFICATION OF DOMINANT DIFFUSING SPECIES IN SILICIDE FORMATION [J]. APPLIED PHYSICS LETTERS, 1974, 25 (08) : 454 - 457

[6] PLATINUM SILICIDE FORMATION - ELECTRON-SPECTROSCOPY OF PLATINUM-PLATINUM SILICIDE INTERFACE [J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (12) : 5141 - 5144

[7] FORMALISM FOR EXTRACTING DIFFUSION-COEFFICIENTS FROM CONCENTRATION PROFILES [J]. SURFACE SCIENCE, 1976, 54 (01) : 79 - 90

[8] SOLID-SOLID REACTIONS IN PT-SI SYSTEMS [J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (06) : 2913 - +

[9] INFLUENCE OF NATURE OF SI SUBSTRATE ON NICKEL SILICIDE FORMED FROM THIN NI FILMS [J]. THIN SOLID FILMS, 1976, 38 (02) : 143 - 150

[10] KINETICS AND MECHANISM OF PLATINUM SILICIDE FORMATION ON SILICON [J]. APPLIED PHYSICS LETTERS, 1974, 24 (08) : 391 - 393