X-RAY INTERFERENCE IN ULTRATHIN EPITAXIAL LAYERS - A VERSATILE METHOD FOR THE STRUCTURAL-ANALYSIS OF SINGLE QUANTUM WELLS AND HETEROINTERFACES

被引：151

作者：

TAPFER, L

PLOOG, K

机构：

来源：

PHYSICAL REVIEW B | 1989年 / 40卷 / 14期

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D O I：

10.1103/PhysRevB.40.9802

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

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页码：9802 / 9810

页数：9

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