Effect of a Au overlayer on thermal stability of Pt transparent ohmic contact on p-type GaN

被引:9
作者
Kim, JK [1 ]
Lee, JL [1 ]
机构
[1] Pohang Univ Sci & Technol, Dept Mat Sci & Engn, Pohang 790784, Kyungbuk, South Korea
关键词
D O I
10.1149/1.1456924
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
The effect of a Au overlayer on the thermal stability of Pt transparent ohmic contacts on p-type GaN was investigated. The contact resistivity for the Pt contact (100 Angstrom) rapidly increased from 3.7 x 10(-4) to 8.8 Omega cm(2) after annealing for 16 h at 550degreesC. However, no degradation in the contact resistivity was found by incorporating the Au overlayer (50 Angstrom) on the Pt contact (50 Angstrom). The degradation of the Pt contact originated from the out-diffusion of N atoms producing N vacancies below the contact, resulting in a decrease in the net concentration of holes. For the Pt/Au contact, the Au layer acts as a sink for Ga atoms, causing the production of Ga vacancies below the contact. This suppresses the decrease of net concentration of holes, leading to a thermally stable ohmic contact. (C) 2002 The Electrochemical Society.
引用
收藏
页码:G266 / G270
页数:5
相关论文
共 20 条
[1]   Development of Pt-based ohmic contact materials for p-type GaN [J].
Arai, T ;
Sueyoshi, H ;
Koide, Y ;
Moriyama, M ;
Murakami, M .
JOURNAL OF APPLIED PHYSICS, 2001, 89 (05) :2826-2831
[2]   W and WSix Ohmic contacts on p- and n-type GaN [J].
Cao, XA ;
Ren, F ;
Pearton, SJ ;
Zeitouny, A ;
Eizenberg, M ;
Zolper, JC ;
Abernathy, CR ;
Han, J ;
Shul, RJ ;
Lothian, JR .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1999, 17 (04) :1221-1225
[3]   Low-resistance ohmic contacts on p-type GaN using Ni/Pd/Au metallization [J].
Chu, CF ;
Yu, CC ;
Wang, YK ;
Tsai, JY ;
Lai, FI ;
Wang, SC .
APPLIED PHYSICS LETTERS, 2000, 77 (21) :3423-3425
[4]   Low-resistance ohmic contacts to p-type GaN [J].
Ho, JK ;
Jong, CS ;
Chiu, CC ;
Huang, CN ;
Chen, CY ;
Shih, KK .
APPLIED PHYSICS LETTERS, 1999, 74 (09) :1275-1277
[5]   InGaN/GaN multiple quantum well light-emitting diodes with highly transparent Pt thin film contact on p-GaN [J].
Huh, C ;
Kim, HS ;
Kim, SW ;
Lee, JM ;
Kim, DJ ;
Lee, IH ;
Park, SJ .
JOURNAL OF APPLIED PHYSICS, 2000, 87 (09) :4464-4466
[6]  
IHSAN B, 1987, THERMOCHEM DATA PURE, P587
[7]  
Kim CC, 2001, MRS INTERNET J N S R, V6, P1
[8]   Effect of an oxidized Ni/Au p contact on the performance of GaN/InGaN multiple quantum well light-emitting diodes [J].
Kim, H ;
Kim, DJ ;
Park, SJ ;
Hwang, H .
JOURNAL OF APPLIED PHYSICS, 2001, 89 (02) :1506-1508
[9]   Low resistance Pd/Au ohmic contacts to p-type GaN using surface treatment [J].
Kim, JK ;
Lee, JL ;
Lee, JW ;
Shin, HE ;
Park, YJ ;
Kim, T .
APPLIED PHYSICS LETTERS, 1998, 73 (20) :2953-2955
[10]  
Lee JL, 2000, ELECTROCHEM SOLID ST, V3, P53