共 24 条
- [1] SELENIUM-TERMINATED AND TELLURIUM-TERMINATED GAAS(100) SURFACES OBSERVED BY SCANNING-TUNNELING-MICROSCOPY [J]. PHYSICAL REVIEW B, 1994, 49 (08): : 5424 - 5428
- [2] SURFACE RECONSTRUCTIONS OF GAAS(100) OBSERVED BY SCANNING TUNNELING MICROSCOPY [J]. PHYSICAL REVIEW B, 1990, 41 (09): : 5701 - 5706
- [3] SCANNING TUNNELING MICROSCOPY STUDIES OF SEMICONDUCTOR SURFACE PASSIVATION [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1993, 32 (3B): : 1484 - 1492
- [5] PASSIVATION OF GAAS(001) SURFACES BY INCORPORATION OF GROUP-VI ATOMS - A STRUCTURAL INVESTIGATION [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (04): : 2256 - 2262
- [6] THE EFFECT OF (NH4)2S TREATMENT ON THE INTERFACE CHARACTERISTICS OF GAAS MIS STRUCTURES [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1988, 27 (07): : L1331 - L1333
- [7] FINE-STRUCTURE OF THE GAAS(001) SURFACE [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (03): : 2107 - 2110
- [8] STRUCTURES OF AS-RICH GAAS(001)-(2X4) RECONSTRUCTIONS [J]. PHYSICAL REVIEW LETTERS, 1994, 73 (16) : 2208 - 2211