The shape of self-assembled InAs islands grown by molecular beam epitaxy

被引:13
作者
Lee, H [1 ]
Yang, WD
Sercel, PC
Norman, AG
机构
[1] Univ Oregon, Inst Mat Sci, Dept Phys, Eugene, OR 97403 USA
[2] Univ Oregon, Oregon Ctr Opt, Eugene, OR 97403 USA
[3] Natl Renewable Energy Lab, Golden, CO 80401 USA
关键词
{136} facets; atomic force microscopy (AFM); cross-section transmission electron microscopy (TEM); InAs quantum dot shape; polarization-resolved photoluminescence (PL); reflection high energy electron diffraction (RHEED);
D O I
10.1007/s11664-999-0098-7
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have determined the shape of InAs quantum dots using reflection high energy electron diffraction. Our results indicate that self-assembled InAs islands possess a pyramidal shape with {136} bounding facets. This shape is characterized by C-2 upsilon symmetry and a parallelogram base, which is elongated along the [1(1) over bar 0] direction. Cross-sectional transmission electron microscopy images taken along the [110] and [1(1) over bar 0] directions as well as atomic force microscopy images strongly support the {136} shape. Furthermore, polarization-resolved photoluminescence spectra show-strong in-plane anisotropy, with emission predominantly polarized along the [1(1) over bar 0] direction, consistent with the proposed quantum dot shape.
引用
收藏
页码:481 / 485
页数:5
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