Thermal stability of sulfur-treated InP investigated by photoluminescence

被引:4
作者
Han, IK
Woo, DH
Kim, HJ
Kim, EK
Lee, JI
Kim, SH
Kang, KN
Lim, H
Park, HL
机构
[1] AJOU UNIV, DEPT ELECT ENGN, SUWON 442749, SOUTH KOREA
[2] YONSEI UNIV, DEPT PHYS, SEOUL 120749, SOUTH KOREA
关键词
D O I
10.1063/1.363366
中图分类号
O59 [应用物理学];
学科分类号
摘要
The effect of sulfur (S) treatments on InP is investigated by low-temperature photoluminescence (PL) measurements. For both n- and p-InP, the PL intensity is observed to increase about four times in magnitude if the scattering by Ihs: S overlayer is relatively small. Some PL bands are observed to disappear after S treatments and then reappear if the S-treated surface is heat treated at 220 degrees C in a vacuum of 10(-3) Torr. By observing their dependence on the excitation power density, the doping level of the samples, and measurement temperature, these PL bands are ascribed to the optical transitions via surface states. Our results thus indicate that the S-treated InP surface may not be stable al a subsequent processing temperature of about 250 degrees C. (C) 1996 American Institute of Physics.
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收藏
页码:4052 / 4057
页数:6
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