Synthesis of oxide thin films and overlayers by atomic layer epitaxy for advanced applications

被引:149
作者
Niinisto, L [1 ]
Ritala, M [1 ]
Leskela, M [1 ]
机构
[1] UNIV HELSINKI,DEPT CHEM,FIN-00014 HELSINKI,FINLAND
来源
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1996年 / 41卷 / 01期
关键词
atomic layer epitaxy; organometallics; oxide thin films;
D O I
10.1016/S0921-5107(96)01617-0
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Atomic layer epitaxy (ALE) as a self-limiting thin film growth process results in several practical advantages including accurate and simple thickness control, large area and large batch capability, good conformality and reproducibility, straightforward doping and scale-up, possibility to produce sharp and tailored interfaces as well as capability to prepare multilayer structures in a continuous process. In this paper the use of ALE in deposition of numerous conducting and insulating oxide thin films will be reviewed. The versatile ALE chemistry allows the use of different types of metal-containing precursors from simple inorganic compounds to organometallics. Commonly used oxygen sources include water, oxygen, ozone, hydrogen peroxide and alcohols. The recent advances in oxide ALE processes, i.e. deposition of ternary and quaternary oxides, controlled doping of transparent conductors, preparation of multilayer structures as well as conformal coating of porous silicon will also be discussed in respect to their practical applications.
引用
收藏
页码:23 / 29
页数:7
相关论文
共 61 条
  • [11] FAN JF, 1991, MATER RES SOC SYMP P, V222, P327, DOI 10.1557/PROC-222-327
  • [12] MULTICOLOR THIN-FILM ELECTROLUMINESCENT DISPLAYS - A NEW APPLICATION OF RARE-EARTH-METALS
    HARKONEN, G
    LEPPANEN, M
    SOININEN, E
    TORNQVIST, R
    VILJANEN, J
    [J]. JOURNAL OF ALLOYS AND COMPOUNDS, 1995, 225 (1-2) : 552 - 554
  • [13] SEQUENTIAL SURFACE CHEMICAL-REACTION LIMITED GROWTH OF HIGH-QUALITY AL2O3 DIELECTRICS
    HIGASHI, GS
    FLEMING, CG
    [J]. APPLIED PHYSICS LETTERS, 1989, 55 (19) : 1963 - 1965
  • [14] GROWTH AND CHARACTERIZATION OF ALUMINUM-OXIDE THIN-FILMS DEPOSITED FROM VARIOUS SOURCE MATERIALS BY ATOMIC LAYER EPITAXY AND CHEMICAL VAPOR-DEPOSITION PROCESSES
    HILTUNEN, L
    KATTELUS, H
    LESKELA, M
    MAKELA, M
    NIINISTO, L
    NYKANEN, E
    SOININEN, P
    TIITTA, M
    [J]. MATERIALS CHEMISTRY AND PHYSICS, 1991, 28 (04) : 379 - 388
  • [15] THE SURFACE-MORPHOLOGY OF ATOMIC LAYER DEPOSITED MAGNESIA
    HUANG, R
    KITAI, AH
    [J]. JOURNAL OF MATERIALS SCIENCE LETTERS, 1993, 12 (18) : 1444 - 1446
  • [16] TEMPERATURE-DEPENDENCE OF THE GROWTH ORIENTATION OF ATOMIC LAYER GROWTH MGO
    HUANG, R
    KITAI, AH
    [J]. APPLIED PHYSICS LETTERS, 1992, 61 (12) : 1450 - 1452
  • [17] LAYERED TANTALUM-ALUMINUM OXIDE-FILMS DEPOSITED BY ATOMIC LAYER EPITAXY
    KATTELUS, H
    YLILAMMI, M
    SAARILAHTI, J
    ANTSON, J
    LINDFORS, S
    [J]. THIN SOLID FILMS, 1993, 225 (1-2) : 296 - 298
  • [18] KATTELUS H, 1993, MATER RES SOC SYMP P, V284, P511
  • [19] CERAMIC LAYER EPITAXY BY PULSED LASER DEPOSITION IN AN ULTRAHIGH-VACUUM SYSTEM
    KOINUMA, H
    NAGATA, H
    TSUKAHARA, T
    GONDA, S
    YOSHIMOTO, M
    [J]. APPLIED PHYSICS LETTERS, 1991, 58 (18) : 2027 - 2029
  • [20] CONTROLLED FORMATION OF OXIDE MATERIALS BY LASER MOLECULAR-BEAM EPITAXY
    KOINUMA, H
    YOSHIMOTO, M
    [J]. APPLIED SURFACE SCIENCE, 1994, 75 : 308 - 319