Direct Imaging of Lithium Ions Using Aberration-Corrected Annular-Bright-Field Scanning Transmission Electron Microscopy and Associated Contrast Mechanisms

被引：18

作者：

He, Xiaoqing ^{[1
]}

Gu, Lin ^{[1
,2
]}

Zhu, Changbao ^{[3
]}

Yu, Yan ^{[3
]}

Li, Chilin ^{[3
]}

Hu, Yong-Sheng ^{[1
]}

Li, Hong ^{[1
]}

Tsukimoto, Susumu ^{[2
]}

Maier, Joachim ^{[3
]}

Ikuhara, Yuichi ^{[2
,4
,5
]}

Duan, Xiaofeng ^{[1
]}

机构：

[1] Chinese Acad Sci, Beijing Natl Lab Condensed Matter Phys, Inst Phys, Beijing 100190, Peoples R China

[2] WPI Adv Inst Mat Res, Sendai, Miyagi 9808577, Japan

[3] Max Planck Inst Solid State Res, D-70569 Stuttgart, Germany

[4] Japan Fine Ceram Ctr, Nanostruct Res Lab, Nagoya, Aichi 4568587, Japan

[5] Univ Tokyo, Inst Engn Innovat, Tokyo 1138656, Japan

来源：

MATERIALS EXPRESS | 2011年 / 1卷 / 01期

关键词：

Annular-Bright-Field (ABF); Aberration-Correction; Scanning Transmission Electron Microscopy (STEM); Lithium-Ion Battery; ENERGY; RESOLUTION; LIFEPO4; CRYSTALS; STORAGE; DESIGN;

D O I：

10.1166/mex.2011.1006

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The vast potential and fast development of implementing lithium-based batteries as an alternative power source to replace the existing low-efficiency and environmental-hazardous materials have urged an ever expediting pace for investigation of the corresponding characterization methods, in particular to observe lithium ions at atomic scale. Here we demonstrate a feasible annular-bright-field (ABF) imaging method based on aberration-corrected scanning transmission electron microscopy to observe lithium ions directly at atomic resolution using LiFePO4, a positive electrode material routinely used, for a case study. In addition, we performed extensive image simulations, including the influences from specimen thickness, high tension, illumination angle, collection angle, material vacancy and lattice distortion, to compare and interpret explicitly the displayed image contrast and the attainable optimum operation conditions.

引用

页码：43 / 50

页数：8

共 38 条

[1] Nanostructured materials for advanced energy conversion and storage devices [J].

Aricò, AS ;

Bruce, P ;

Scrosati, B ;

Tarascon, JM ;

Van Schalkwijk, W .

NATURE MATERIALS, 2005, 4 (05) :366-377

[2] Sub-angstrom resolution using aberration corrected electron optics [J].

Batson, PE ;

Dellby, N ;

Krivanek, OL .

NATURE, 2002, 418 (6898) :617-620

[3] Nanomaterials for rechargeable lithium batteries [J].

Bruce, Peter G. ;

Scrosati, Bruno ;

Tarascon, Jean-Marie .

ANGEWANDTE CHEMIE-INTERNATIONAL EDITION, 2008, 47 (16) :2930-2946

[4] Electron microscopy study of the LiFePO4 to FePO4 phase transition [J].

Chen, GY ;

Song, XY ;

Richardson, TJ .

ELECTROCHEMICAL AND SOLID STATE LETTERS, 2006, 9 (06) :A295-A298

[5] IMAGE CONTRAST IN A TRANSMISSION SCANNING ELECTRON MICROSCOPE [J].

COWLEY, JM .

APPLIED PHYSICS LETTERS, 1969, 15 (02) :58-&

[6] Lithium deintercalation in LiFePO4 nanoparticles via a domino-cascade model [J].

Delmas, C. ;

Maccario, M. ;

Croguennec, L. ;

Le Cras, F. ;

Weill, F. .

NATURE MATERIALS, 2008, 7 (08) :665-671

[7] Limits to the spatial, energy and momentum resolution of electron energy-loss spectroscopy [J].

Egerton, R. F. .

ULTRAMICROSCOPY, 2007, 107 (08) :575-586

[8] Radiation damage in the TEM and SEM [J].

Egerton, RF ;

Li, P ;

Malac, M .

MICRON, 2004, 35 (06) :399-409

[9] Dynamics of annular bright field imaging in scanning transmission electron microscopy [J].

Findlay, S. D. ;

Shibata, N. ;

Sawada, H. ;

Okunishi, E. ;

Kondo, Y. ;

Ikuhara, Y. .

ULTRAMICROSCOPY, 2010, 110 (07) :903-923

[10] Robust atomic resolution imaging of light elements using scanning transmission electron microscopy [J].

Findlay, S. D. ;

Shibata, N. ;

Sawada, H. ;

Okunishi, E. ;

Kondo, Y. ;

Yamamoto, T. ;

Ikuhara, Y. .

APPLIED PHYSICS LETTERS, 2009, 95 (19)

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