Investigation of mid-infrared type-II "W" diode lasers

被引:31
作者
Canedy, CL [1 ]
Bewley, WW [1 ]
Lindle, JR [1 ]
Kim, CS [1 ]
Kim, M [1 ]
Vurgaftman, I [1 ]
Meyer, JR [1 ]
机构
[1] USN, Res Lab, Washington, DC 20375 USA
关键词
semiconductor lasers; mid-infrared lasers; quantum wells; type-II active regions;
D O I
10.1007/BF02690532
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report an experimental investigation of 16 different mid-infrared diode laser samples with type-II "W" active regions. A number of design modifications were employed to study effects on the I-V characteristics, lasing threshold, and wallplug efficiency. Contrary to expectations, the threshold current density at low temperatures did not vary significantly with the number of active quantum-well periods, nor was there any clear correlation between lasing threshold and photoluminescence intensity. A shorter-wavelength device (3.2-3.6 mu m) produced > 500 mW of cw power at 80 K, and a second device displayed a wallplug efficiency > 10%. The maximum lasing temperature was 317 K for pulsed operation and 218 K for cw operation. At T = 100 K, cavity-length studies indicated an internal loss of 7 cm(-1) and nominal internal efficiency of 96%. Hakki-Paoli measurements of the gain spectrum implied an intrinsic linewidth enhancement factor of similar to 1.3, which slightly exceeds the theoretical prediction. Longer-wavelength devices (lambda approximate to 3.8-4.5 mu m) showed similarly low threshold current densities at T = 80 K but degraded more rapidly with increasing temperature.
引用
收藏
页码:453 / 461
页数:9
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