SiGe alloys and heterojunctions - Extending the performance of Si devices

被引:9
作者
Kasper, E
机构
[1] Institut für Halbleitertechnik, Univ. Stuttgart, B., Stuttgart
关键词
D O I
10.1016/S1359-0286(97)80104-0
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Advanced growth methods like molecular beam epitaxy and chemical vapour deposition allow the epitaxy of SiGe layers on Si substrates at rather low temperatures (typically 500 degrees C-750 degrees C). With Ge on Si, island growth commences which may be exploited for self-assembled nanostructures. The frequency limit of heterobipolar transistors with an SiGe base clearly exceeds 100 GHz. A variety of heterojunction field effect transistors, optoelectronic devices and novel device structures like the charge injection transistor demonstrate improved performance data.
引用
收藏
页码:48 / 53
页数:6
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