Transparent and semitransparent conducting film deposition by reactive-environment, hollow cathode sputtering

被引:44
作者
Delahoy, AE [1 ]
Guo, SY [1 ]
机构
[1] Energy Photovolta Inc, Lawrenceville, NJ 08648 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 2005年 / 23卷 / 04期
关键词
D O I
10.1116/1.1894423
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Highly transparent and conductive In2O3 and ZnO films containing different doping elements such as Ti, Mo, Zr, Nb, Ta, W (for In2O3), and B (for ZnO) have been prepared by reactive-environment, hollow cathode sputtering (RE-HCS). The use of Nb and W as effective dopants is reported for the first time. Metallic targets were used exclusively, and the dopant concentration was easily controlled using a second sputtering power supply. As a result of the cathode and gas flow geometry, the sputtering is conducted in metal mode, and the target and doping materials are free from oxidation during the deposition process. Film resistivities achieved with the various dopants are reported. For In2O3: Mo (IMO), a resistivity of 1.6 x 10(-4) Omega cm and a mobility of 80 cm(2)/VS were achieved for Mo concentrations in the range 0.5-5.0% as measured by inductively coupled plasma (ICP). X-ray photoelectron spectroscopy (XPS) analysis indicates Mo with a +6 valence state and that the film is stoichiometric. For In2O3:Ti (ITiO), a superior optical transmission is achieved relative to IMO, while carrier mobility and conductivity were similar. Remarkably, semitransparent films of InN:O having sheet resistances of 9.5 Omega/square have also been prepared. ZnO:B films deposited by RE-HCS exhibit superior optical properties relative to ZnO:AI, and when applied as a window layer to CIGS solar cells yield higher quantum efficiencies. (c) 2005 American Vacuum Society.
引用
收藏
页码:1215 / 1220
页数:6
相关论文
共 14 条
[1]   Optimization of In2O3 transparent conductive films by Ge ion implantation [J].
Ali, EB ;
Sorensen, G ;
Querfelli, J ;
Bernède, JC ;
El Maliki, H .
APPLIED SURFACE SCIENCE, 1999, 152 (1-2) :1-9
[2]   Atomic layer deposition growth of zirconium doped In2O3 films [J].
Asikainen, T ;
Ritala, M ;
Leskelä, M .
THIN SOLID FILMS, 2003, 440 (1-2) :152-154
[3]   THE ELECTRONIC EFFECT OF TI4+, ZR4+ AND GE4+ DOPINGS UPON THE PHYSICAL-PROPERTIES OF IN2O3 AND SN-DOPED IN2O3 CERAMICS - APPLICATION TO NEW HIGHLY-TRANSPARENT CONDUCTIVE ELECTRODES [J].
CAMPET, G ;
HAN, SD ;
WEN, SJ ;
MANAUD, JP ;
PORTIER, J ;
XU, Y ;
SALARDENNE, J .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1993, 19 (03) :285-289
[4]   Characterization of transparent conducting oxides [J].
Coutts, TJ ;
Young, DL ;
Li, XN .
MRS BULLETIN, 2000, 25 (08) :58-65
[5]   New technologies for CIGS photovoltaics [J].
Delahoy, AE ;
Chen, LF ;
Akhtar, M ;
Sang, BS ;
Guo, SY .
SOLAR ENERGY, 2004, 77 (06) :785-793
[6]   Reactive-environment, hollow cathode sputtering:: Basic characteristics and application to Al2O3, doped ZnO, and In2O3:MO [J].
Delahoy, AE ;
Guo, SY ;
Paduraru, C ;
Belkind, A .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2004, 22 (04) :1697-1704
[7]  
DELAHOY AE, 2004, P 19 EU PVSEC PAR, P1686
[8]   ELECTRICAL-PROPERTIES AND DEFECT MODEL OF TIN-DOPED INDIUM OXIDE LAYERS [J].
FRANK, G ;
KOSTLIN, H .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1982, 27 (04) :197-206
[9]   Non-vacuum and PLD growth of next generation TCO materials [J].
Ginley, D ;
Roy, B ;
Ode, A ;
Warmsingh, C ;
Yoshida, Y ;
Parilla, P ;
Teplin, C ;
Kaydanova, T ;
Miedaner, A ;
Curtis, C ;
Martinson, A ;
Coutts, T ;
Readey, D ;
Hosono, H ;
Perkins, J .
THIN SOLID FILMS, 2003, 445 (02) :193-198
[10]  
Inoue S, 2004, VACUUM, V74, P443, DOI [10.1016/j.vacumm.2004.01.010, 10.1016/j.vacuum.2004.01.010]