Process controlled microstructural and binding properties of hard physical vapor deposition films

被引:13
作者
Oechsner, H
机构
[1] Univ Kaiserslautern, Fachbereich Phys, D-67653 Kaiserslautern, Germany
[2] Univ Kaiserslautern, Schwerpunkt Mat Wissensch, D-67653 Kaiserslautern, Germany
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 1998年 / 16卷 / 03期
关键词
D O I
10.1116/1.581203
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The influence of the ion-to-atom flux ratio and the ion energy on the texture development and the grain size is exemplified for well controlled ion beam assisted and plasma beam deposition of TiN films. The dependence of the atomic binding configuration in hard carbon and nitride films on the energy input during film growth is also addressed with special emphasis on a possible synthesis of the hypothetical beta-C3N4 phase. (C) 1998 American Vacuum Society.
引用
收藏
页码:1956 / 1962
页数:7
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