Numerical analysis of indirect Auger transitions in InGaN

被引:77
作者
Bertazzi, Francesco [1 ,2 ,3 ]
Goano, Michele [1 ,2 ]
Bellotti, Enrico [3 ]
机构
[1] Politecn Torino, Dipartimento Elettron & Telecomunicaz, I-10129 Turin, Italy
[2] Politecn Torino, IEIIT CNR, I-10129 Turin, Italy
[3] Boston Univ, ECE Dept, Boston, MA 02215 USA
关键词
LIGHT-EMITTING-DIODES; RECOMBINATION RATE; EFFICIENCY DROOP; MONTE-CARLO;
D O I
10.1063/1.4733353
中图分类号
O59 [应用物理学];
学科分类号
摘要
Indirect phonon-assisted Auger recombination mechanisms in bulk InGaN are investigated in the framework of perturbation theory, using first-principles phonon spectral density functions and electronic structures obtained by nonlocal empirical pseudopotential calculations. Nonpolar carrier-phonon interactions are treated within the rigid pseudoion framework, thus avoiding the introduction of empirical deformation potentials. The calculated indirect Auger coefficients exhibit a weak temperature dependence and dominate over direct processes for alloy compositions corresponding to the entire visible spectrum. The present results suggest that indirect Auger processes may be relevant in the operation of InGaN-based light-emitting diodes and lasers, at least in the yellow-green spectral region. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4733353]
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页数:4
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